Physics / Fizik
Permanent URI for this collectionhttps://hdl.handle.net/11147/6
Browse
4 results
Search Results
Article Citation - WoS: 8Citation - Scopus: 8Study of Boron Doped Amorphous Silicon Lightly Hydrogenated Prepared by Dc Magnetron Sputtering for Infrared Detectors Applications(Elsevier Ltd., 2020) Ketroussi, K.; Cherfi, R.; Yahia, Seba, H.; Tata, S.; Chabane, L.; Özyüzer, Lütfi; Rahal, A.The objective of this study is to investigate the effect of boron doping concentration on the bolometric properties of lightly hydrogenated amorphous silicon doped with boron (a-Si: H(B)) films. Thin film a-Si: H(B) samples with different boron concentrations are prepared by co-sputtering of boron and silicon at relatively low hydrogen pressure. FTIR analyses show that the intensity of the characteristic peak of the substitutional boron gradually increases with the addition of boron. Increasing in boron concentration affects the bolometric properties of the lightly hydrogenated a-Si: H (B) films, including conductivity at room temperature (?RT) and thermal resistance coefficient (TCR). Indeed, when the boron concentration increases from 1.5 to 43%, ?RT increases from 1.4 10?6 to 2 10?3 ??1 cm?1 while the absolute value of TCR decreases from 3% to 8% K?1, respectively. In addition, lightly hydrogenated a-Si: H (B) films exhibit good thermal stability. We have showed in this study that lightly hydrogenated a-Si: H(B) can be considered as a potential candidate for low-cost, high-performance uncooled micro bolometers. © 2020 Elsevier B.V.Article Citation - WoS: 3Citation - Scopus: 4Lipid Bilayer on Wrinkled-Interfaced Graphene Field Effect Transistor(Elsevier Ltd., 2021) Özkendir İnanç, Dilce; Çelebi, Cem; Yıldız, Ümit HakanThis study describes lipid bilayer-based sensor interface on SiO2 encapsulated graphene field effect transistors (GFET). The SiO2 layer was utilized as a lipid compatible surface that drives bilayer formation. The two types of surface morphologies i) wrinkled morphology by thermal evaporation (TE) and ii) flat morphology by pulsed electron deposition (PED) were obtained. The sensing performance of wrinkled and flat interfaced-GFETs were investigated, pH sensitivity of wrinkled interfaced-GFETs were found to be ten fold larger than the flat ones. The enhanced sensitivity is attributed to thinning of the oxide layer by formation of wrinkles thereby facilitating electrostatic gating on graphene. We foresee that described wrinkled SiO2 interfaced-GFET holds promise as a cell membrane mimicking sensing platform for novel bioelectronic applications. © 2020Article Citation - WoS: 7Citation - Scopus: 8Investigation of the Structural and Optical Properties of Copper-Titanium Oxide Thin Films Produced by Changing the Amount of Copper(Elsevier Ltd., 2019) Horzum, Şeyda; Gürakar, Sibel; Serin, TülayWe examine how the structural, morphological and optical properties of TiO2 thin films are changed with heavily copper (Cu) content. Variations in characteristic properties of the films with 0, 12.5, 25 and 50 wt% Cu contents, grown by sol-gel dip coating method, are observed by using X-ray diffraction (XRD), Raman scattering, atomic force microscopy, energy dispersive X-ray analysis and optical spectroscopy measurements. The XRD and Raman spectra indicate that pure TiO2 film forms in the anatase structure. At high Cu concentrations, XRD results also reveal the substitution of Ti with Cu and formation of extra compound Copper-Titanium oxide. Raman measurements also show that Cu is incorporated homogeneously into TiO2 matrix up to 12.5 wt% concentration and this uniformity is distorted at higher Cu contents. In addition, optical spectroscopy measurements show that the optical band gap energy decreases from 3.26 eV to 2.05 eV with increasing Cu concentration. Furthermore, it is observed that the refractive index values obtained by means of transmittance spectra at 550 nm wavelength; increases from 2.47 to 3.39 when the Cu concentration increases from 0 to 50 wt %.Article Citation - WoS: 5Citation - Scopus: 5Effect of the Synthesis Conditions on the Properties of Co Embedded Porous Si Nanostructures(Elsevier Ltd., 2019) Çetinel, Alper; Artunç, Nurcan; Tarhan, EnverThe electrodeposition of cobalt in the porous silicon (PSi) substrate was investigated in terms of the deposition times and current densities. The PSi/Co samples were characterized by SEM, XRD, Raman, and photoluminescence (PL) spectroscopies. The results indicated that for all current densities, the PL intensities of PSi/Co samples with shorter deposition times (t(s) <= 20 min) increased due to spherical Co nanoparticles (NPs) could be created the new recombination centers, compared to that of the undeposited PSi. On the other hand, the PL intensity of PSi/Co samples significantly decreased at longer deposition times (t(1) > 20 min) because of larger Co NP cluster promoted the formation of non-radiative centers. The increased PL intensities in samples with t(s) were attributed to both the quantum confinement effect and surface effects. PL analyses also suggested that after exposure to air for 60 days, PL characteristics of PSi/Co were stabilized depending on deposition time and current density.