Physics / Fizik
Permanent URI for this collectionhttps://hdl.handle.net/11147/6
Browse
6 results
Search Results
Article Citation - WoS: 16Citation - Scopus: 18Study of Undoped and Indium Doped Zno Thin Films Deposited by Sol Gel Method(Springer Verlag, 2018) Medjaldi, M.; Özyüzer, Lütfi; Boudine, B.; Zaabat, M.; Halimi, O.; Sebais, M.; Özyüzer, Lütfi; 04.05. Department of Pyhsics; 04. Faculty of Science; 01. Izmir Institute of TechnologyIn this paper, we report the effects of Indium doping concentrations (from 0 to 10wt%) on the structural, morphological, and optical properties of deposited In doped ZnO (IZO) thin films prepared by the sol–gel method through the dip coating technique. X-ray diffraction (XRD) analysis indicates that all ZnO thin films have a polycrystalline nature with a hexagonal wurtzite phase with (002) as a preferential orientation. XRD results demonstrate that the particle size of ZnO decreased with the increase in Indium concentrations. Raman scattering spectra confirmed the wurtzite phase and the presence of intrinsic defects in our samples. Energy dispersive spectroscopy (EDS) and the X-ray photoelectron spectroscopy (XPS) measurements, confirmed the presence of zinc, oxygen and indium elements which is in agreement with XPS results. The photoluminescence (PL) spectra of the films exhibit defects-related visible emission peaks, with intensities differing owing to different concentrations of zinc vacancies. UV–Vis spectrometer measurements show that all the films are highly transparent in the visible wavelength region (≥ 70%) and presented two different absorption edges at about 3.21 eV and 3.7 eV, these may be correspond to the band gap of zinc oxide and indium oxide respectively.Article Citation - WoS: 11Citation - Scopus: 13Metal Mesh Filters Based on Ti, Ito and Cu Thin Films for Terahertz Waves(Springer Verlag, 2016) Demirhan, Yasemin; Alaboz, Hakan; Demirhan, Yasemin; Nebioğlu, Mehmet Ali; Özyüzer, Lütfi; Altan, Hakan; Sabah, Cumali; 04.05. Department of Pyhsics; 04. Faculty of Science; 01. Izmir Institute of TechnologyIn this study, we have investigated the spectral performance of resonant terahertz (THz) bandpass filters which were produced from thin films with a metal-mesh shape. The aforementioned filters were fabricated from titanium, copper and indium tin oxide thin films on fused silica substrates by UV lithography with an array of cross-shaped apertures. Since the mesh period, cross-arm length and its width specify the spectral characteristics of the filters, we were able to reveal the performance of these filters experimentally using both a THz time domain spectrometer and a Fourier transform infrared spectrometer. A commercial electromagnetic simulation software, CST microwave studio, was used to verify the experimental data. The transmission of the filters are in the range 20–55 % at their relevant center frequencies. To our knowledge this study is the first to show that fabricated patterns based on ITO thin films can be used to filter THz radiation.Article Citation - WoS: 6Citation - Scopus: 7Thin Film Like Terahertz Bolometric Detector on Bi2212 Single Crystal(Springer Verlag, 2016) Semerci, Tuğçe; Demirhan, Yasemin; Demirhan, Yasemin; Wang, Huabing; Özyüzer, Lütfi; 04.05. Department of Pyhsics; 04. Faculty of Science; 01. Izmir Institute of TechnologyIn this study, we developed a microbolometer chip fabricated from high temperature superconducting Bi2Sr2CaCu2O8+δ (Bi2212) single crystals for the terahertz (THz) detection. For the manufacturing of the microbolometer chips, Bi2212 single crystals were transferred on substrate in the thin film like form and electron beam lithography, ion beam etching techniques were used. Resistance versus temperature behavior of the bolometer chips were performed by four probe technique in liquid nitrogen cryostat. Bi2212 microchips were integrated and characterized using in our custom-designed cryogenic bolometer system instead of expensive and massive cooling systems. The fabricated microchips significantly detected signals from the Stefan-Boltzmann lamp which includes a portion of THz radiation. The detected power and response time were studied for Bi2212 thin film like microbolometer chips. Our results demonstrated the feasibility of improved Bi2212 microchips could be used for bolometric detection for THz applications.Article Citation - WoS: 13Citation - Scopus: 14Electronic Transport Properties of Microcrystalline Silicon Thin Films Prepared by Vhf-Pecvd(Springer Verlag, 2004) Okur, Salih; Güneş, Mehmet; Göktaş, Oktay; Finger, Friedhelm; Okur, Salih; 04.05. Department of Pyhsics; 04. Faculty of Science; 01. Izmir Institute of TechnologySteady-state photocarrier grating (SSPG) and steady-state photoconductivity, σph, experiments have been carried out to investigate the electronic transport properties of undoped hydrogenated microcrystalline silicon (μc-Si: H) films prepared with very high frequency plasma enhanced chemical vapor deposition (VHF-PECVD). Material with different crystalline volume fractions was obtained by variation of the silane concentration (SC) in the process gas mixture. Pure amorphous silicon material was investigated for comparison. The ambipolar diffusion length, L amb, which is dominated by the minority carrier properties, is obtained both from the best fit to the experimental photocurrents ratio, β, versus grating period (Λ), and from the "Balberg plot" for the generation rates between 1019 and 1021 cm -3 s-1. Lamb increases from 86 nm with increasing SC and peaks around 200 nm for the SC = 5.6% and decreases again for higher SCs. Lamb values obtained from the intercept of the Balberg plot result in a small difference of around 5% for most of the samples. Minority carrier mobility-lifetime (μτ)-products are much lower than those of majority carriers, however, both majority and minority carrier μτ-products in microcrystalline silicon are higher than those of undoped hydrogenated amorphous silicon. The grating quality factor (γ 0) changes from 0.70 to 1.0 indicating almost negligible surface roughness present in the samples.Conference Object Citation - WoS: 1Citation - Scopus: 1Conductance Fluctuations in Vhf-Pecvd Grown Hydrogenated Microcrystalline Silicon Thin Films(Springer Verlag, 2003) Güneş, Mehmet; Güneş, Mehmet; Kasap, Safa O.; Finger, Friedhelm; Lambertz, Andreas; 04.05. Department of Pyhsics; 04. Faculty of Science; 01. Izmir Institute of TechnologyCoplanar conductance fluctuations or excess noise of undoped hydrogenated microcrystal-line silicon (μc-Si : H) thin films grown by VHF-PECVD from silane-hydrogen mixtures with silane concentrations from 2% to 6% have been studied between room temperature and 470 K. We report that undoped μc-Si : H thin films show similar noise-power spectra to those of undoped a-Si : H films in a coplanar sample geometry. At lower temperatures, the noise with the slope α = 0.60 ± 0.07 and at higher temperatures, the noise with the slope α close to unity dominate the spectrum. The noise magnitude decreases with decreasing silane concentration and becomes strongly temperature dependent with increased crystal unity.Conference Object Citation - WoS: 5Citation - Scopus: 5Photoconductivity Spectroscopy in Hydrogenated Microcrystalline Silicon Thin Films(Springer Verlag, 2003) Güneş, Mehmet; Akdaş, Deniz; Güneş, Mehmet; Carius, Reinhard; Klomfaß, Josef; Finger, Friedhelm; 04.05. Department of Pyhsics; 04. Faculty of Science; 01. Izmir Institute of TechnologySteady-state photoconductivity and sub-bandgap absorption measurements by the dual-beam photoconductivity (DBF) method were carried out on undoped hydrogenated microcrystalline silicon thin films prepared by VHF-PECVD and hot-wire chemical vapor deposition. The results are compared with those of the constant-photocurrent method (CPM) and photothermal deflection spectroscopy (PDS). It is found that DBP, CPM, and PDS provide complementary data on the optoelectronic processes in microcrystalline silicon.