Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
Permanent URI for this collectionhttps://hdl.handle.net/11147/7148
Browse
2 results
Search Results
Article Citation - WoS: 5Citation - Scopus: 7A Practical Approach for Optical Characterization of a Film Coated on the Optical Fiber(Academic Press Inc., 2017) Ekici, Çağın; Dinleyici, Mehmet SalihPhase Diffraction (PD) Phase Diffraction. which is a result of the interaction of light waves with a transparent object, is exploited to characterize precisely optical properties of dielectric films coated on the optical fiber without harming any feature of the sample. Typical fiber sensor applications require films coated on the side surface of the optical fiber and optical properties of that curved films are crucial for design purposes. In this study, three Polyvinyl Alcohol (PVA) films are prepared, their thicknesses are estimated based on the phase diffraction method by fitting experimental results with a mathematical model within 2.3% error. The outcomes of this practical method show good agreement with findings of the destructive Scanning Electron Microscopy (SEM) measurements. The method has the potential to allow real time monitoring abrupt changes of surrounding medium's properties and to examine coating quality (i.e. thickness uniformity) of the film.Article Citation - WoS: 266Citation - Scopus: 292High Quality Ito Thin Films Grown by Dc and Rf Sputtering Without Oxygen(IOP Publishing Ltd., 2010) Tuna, Öcal; Selamet, Yusuf; Aygün, Gülnur; Özyüzer, LütfiHigh quality indium tin oxide (ITO) thin films were grown without oxygen by both dc and RF magnetron sputtering techniques on glass substrates. The effects of substrate temperature, film thickness and sputtering method on the structural, electrical and optical properties of the as-grown films were investigated. The results showed that the substrate temperature had substantial effects on the film properties, in particular on the crystallization and resistivity. When the substrate temperature was increased to 150 °C, crystallization in the (2 2 2) plane started appearing for both dc and RF sputtered films. We additionally found that with further increments of substrate temperature, the preferred crystallization orientation changed differently for dc and RF sputtered films. Optical transmission in the visible region for a film thickness of 70 nm was found to be above 85%. The bandgap was calculated to be about 3.64 eV for the substrate temperature of 150 °C for a 70 nm thick film. The value of the bandgap increased with respect to the increment in film thickness as well as substrate temperature. We also measured the temperature dependence of the resistivity and Hall coefficient of the films, and calculated the carrier concentration and Hall mobility. Very low room temperature resistivities for dc and RF magnetron sputtered grown films of about 1.28 × 10-4 Ω cm and 1.29 × 10-4 Ω cm, respectively, were obtained. © 2010 IOP Publishing Ltd.