Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection

Permanent URI for this collectionhttps://hdl.handle.net/11147/7148

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  • Article
    Citation - WoS: 32
    Citation - Scopus: 33
    Variation of Structural and Optical Properties of Tio2 Films Prepared by Dc Magnetron Sputtering Method With Annealing Temperature
    (Elsevier Ltd., 2020) Gürakar, Sibel; Ot, Hakan; Horzum, Şeyda; Serin, Tülay
    TiO2 thin films are deposited by direct current magnetron sputtering method on the silicon and quartz substrates. The effect of annealing temperature on the film properties are analysed by using X-ray diffraction (XRD), Raman scattering, atomic force microscopy (AFM), scanning electron microscopy (SEM) and optical spectroscopy measurements. Raman and XRD results reveal that the crystal structure of the TiO2 film is strongly affected by the annealing temperature. The crystal structure of the coated film is changed from amorphous to anatase structure after annealing at 500 degrees C. Anatase and rutile phases of TiO2 start to coexist after annealing at 800 degrees C. Rutile phases of TiO2 become dominant for film annealed at 900 degrees C. SEM and AFM images uncover that the morphology, grain size and surface roughness of TiO2 films vary with the annealing temperature. The optical band gap decreases from 3.35 to 2.90 eV as the phase transforms from amorphous to rutile.
  • Article
    Citation - WoS: 3
    Citation - Scopus: 3
    High-Speed Tapping-Mode Atomic Force Microscopy Using a Q-Controlled Regular Cantilever Acting as the Actuator: Proof-Of Experiments
    (American Institute of Physics, 2014) Balantekin, Müjdat; Satır, Sarp; Torello, David; Değertekin, F. L.
    We present the proof-of-principle experiments of a high-speed actuationmethod to be used in tapping-mode atomic force microscopes (AFM). In this method, we do not employ a piezotube actuator to move the tip or the sample as in conventional AFM systems, but, we utilize a Q-controlled eigenmode of a cantilever to perform the fast actuation. We show that the actuation speed can be increased even with a regular cantilever.
  • Article
    Citation - WoS: 29
    Citation - Scopus: 30
    The Structural, Optical and Morphological Properties of Caf2 Thin Films by Using Thermionic Vacuum Arc (tva)
    (Elsevier Ltd., 2013) Çetin, N. Emre; Korkmaz, Şadan; Elmas, Saliha; Ekem, Naci; Pat, Suat; Balbag, M. Zafer; Tarhan, Enver; Temel, Sinan; Özmumcu, Murat
    In this study, calcium fluoride (CaF2) thin films have been prepared by Thermionic Vacuum Arc (TVA) technique on glass substrates. In this technique CaF2 thin films are produced by condensing the plasma of anode material generated in the TVA setup under high vacuum conditions on glass substrates. Crystal structures as well as optical and surface properties of CaF2 antireflective (AR) coated thin films were investigated. X-ray diffraction (XRD) measurements showed that amorphous CaF2 thin films were formed. Optical and surface properties of CaF2 films have been studied based on optical transmittance, reflectance, refractive index and atomic force microscopy imaging (AFM). Our results also show that CaF2 coated samples exhibit lower reflectance (R). From our optical studies, we have observed that CaF2 thin films have high AR properties.