Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
Permanent URI for this collectionhttps://hdl.handle.net/11147/7148
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Conference Object Avoidance of Feature Configuration Faults in Software Product Lines(IEEE Computer Soc, 2025) Ergun, Burcu; Tuglular, Tugkan; Belli, FevziThis paper presents a validation approach to feature selection in software product lines (SPL). SPLs consist of similar products tailored to different needs, while SPLs sharing a common platform where feature configurations define product families. Validating feature configurations is critical to avoid defective shipments, recalls, and disposal. Exhaustive, pairwise, and combinatorial testing, among others, aim at ensuring configuration correctness. This paper introduces a novel method for improving feature selection and validation in SPLs by minimizing redundancy while ensuring configurations align with customer needs. The method emphasizes uncovering the differences in feature structures through "complex" and "simple" models, which helps identify and helps identify and tolerate potential errors arising from incorrect feature configurations. This ensures broader coverage while effectively managing dependencies. A case study using the Access Point (AP) SPL model, which is a networking device designed to enhance the strength of an existing wireless signal and expand its coverage area. The AP can enable or disable specific features on AP SPL depending on the characteristics of the third-party gateway with which it is integrated. AP SPL model with 66 features lead to 266 configurations, generated by Exhaustive Testing. Pairwise testing achieves 87% coverage with 132 test cases, while combinatorial testing reaches 94% with 45,760 cases. Our method ensures 100% feature coverage with just 3 test configurations. Thus, the approach introduced in this paper enhances product quality while reducing costs by avoiding redundant tests, making the approaches valuable for large-scale SPLs.Article Citation - WoS: 3Citation - Scopus: 6Model-Based Ideal Testing of Gui Programs-Approach and Case Studies(IEEE-Inst Electrical Electronics Engineers inc, 2021) Kilincceker, Onur; Silistre, Alper; Belli, Fevzi; Challenger, MoharramTraditionally, software testing is aimed at showing the presence of faults. This paper proposes a novel approach to testing graphical user interfaces (GUI) for showing both the presence and absence of faults in the sense of ideal testing. The approach uses a positive testing concept to show that the GUI under consideration (GUC) does what the user expects; to the contrary, the negative testing concept shows that the GUC does not do anything that the user does not expect, building a holistic view. The first step of the approach models the GUC by a finite state machine (FSM) that enables the model-based generation of test cases. This is always possible as the GUIs are considered as strictly sequential processes. The next step converts the FSM to an equivalent regular expression (RE) that will be analyzed first to construct test selection criteria for excluding redundant test cases and construct test coverage criteria for terminating the positive test process. Both criteria enable us to assess the adequacy and efficiency of the positive tests performed. The negative tests will be realized by systematically mutating the FSM to model faults, the absence of which are to be shown. Those mutant FSMs will be handled and assessed in the same way as in positive testing. Two case studies illustrate and validate the approach; the experiments' results will be analyzed to discuss the pros and cons of the techniques introduced.
