Master Degree / Yüksek Lisans Tezleri

Permanent URI for this collectionhttps://hdl.handle.net/11147/3008

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  • Master Thesis
    Optical Characterization of Nanoscale Dielectric Films on Curved Surfaces Using Near Field Diffraction Method
    (Izmir Institute of Technology, 2019) Ataç, Enes; Dinleyici, Mehmet Salih; Dinleyici, Mehmet Salih; 03.05. Department of Electrical and Electronics Engineering; 03. Faculty of Engineering; 01. Izmir Institute of Technology
    Demand on the high-quality optical thin films has increased because of the importance in the optical sensor technologies. The thicknesses of such films are usually shorter than the wavelength of visible light. Therefore, the optical characterization of these films is not a routine procedure especially on curved surfaces such as optical fiber. Besides, the methods in the literature and commercially available systems are either expensive, destructive or non-real time. In this thesis, it is aimed to propose a simple, inexpensive and non-destructive optical characterization method of nano-scale dielectric films on curved surfaces. The methodology of that approach can be described as the near field wavefront tracing diffraction by using structured light. In this way, it has been shown that sub-wavelength film thicknesses can be estimated. The proposed diffraction method is organized in four main stages. These are the coating of optical fibers, generation of structured light, determination of wave propagation via the near field Huygens-Fresnel wave-front tracing and sensing and processing of signal from the sensor array. Layer by layer assembly technique is used in coating process to keep under control the thickness of transparent film. Selection of various source types is about to changing of point spread function of applied field and observe the effects on intensity pattern. Using near field diffraction technique, sub-wavelength thickness of thin films can be predicted by taking the higher order components of diffraction pattern by recording at very close proximity to object. In this way, determination of thickness beyond the diffraction limits can be realized. Furthermore, the resolution of sensor array in sensing part is important since pixel size of the sensor array determines your detection limits to catch all variations on diffraction pattern. The whole process has a mathematical model with numerical analysis methods. This dissertation is about the proposing a mathematical estimation model for the optical properties of nano-scale dielectric films coated on curved surfaces. The experimental results show that near field Huygens-Fresnel wave-front tracing method by using structured light is a powerful technique.
  • Master Thesis
    Optical Characterization of Dielectric Films on Curved Surfaces Using Diffraction Method
    (Izmir Institute of Technology, 2016) Ekici, Çağın; Dinleyici, Mehmet Salih; Ekici, Çağın; Dinleyici, Mehmet Salih; 01. Izmir Institute of Technology; 03.05. Department of Electrical and Electronics Engineering; 03. Faculty of Engineering
    In this thesis, we aim to characterize optical properties of thin dielectric films coated on curved surfaces. Indeed, optical thin films attract a great deal of attention especially the ones coated on silica based optical waveguides used as sensor system. Therefore, the step index optical fiber is used in the thesis as a substrate due to the fact that the sensor technology tends towards to fiber optic based platforms. In the thesis, a step index optical fiber is coated with polyvinyl alcohol (PVA), then its thickness is mathematically estimated exploiting Fresnel scalar diffraction method. Phase front of the laser light wave comes across with a phase object (fiber optic), transmits through of it and diffracts. Whole process is modeled by using numerical analysis methods and compared to experimental results to obtain desired parameters in MATLAB. The conventional least-squares method is used for comparison purpose. Although the emphasis is on optical thin film characterization, we demonstrate the application area of diffraction from fiber optic as sensor. It is used to detect adulteration of olive oil that is big concern for the food industry. The refractive index of various mixture of olive oil and sunflower oil is measured with intend to detect adulteration. This feature makes it a good candidate for fiber optic based refractive index sensor and it may bring practicability and precision to the sensing process. This dissertation gives detailed information about diffraction from fiber optic both theoretically and experimentally. The experiments were realized by using 632.8 nm continuous wave laser. Both of the experimental results demonstrate that phase diffraction method is a powerful technique to characterize optical thin films and to sense refractive index of the surrounding medium.