Master Degree / Yüksek Lisans Tezleri

Permanent URI for this collectionhttps://hdl.handle.net/11147/3008

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Department: search.filters.department.Thesis (Master)--İzmir Institute of Technology, Materials Science and EngineeringSubject: search.filters.subject.Atomic force microscopy

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  • Master Thesis
    Investigation Od the Surfaces of Dealkalized and Wethered Float Glass
    (Izmir Institute of Technology, 2016) Seziş, Ümmügülsüm; Şentürk, Ufuk; Şentürk, Ufuk; Zareie, Hadi M.; 03.09. Department of Materials Science and Engineering; 03. Faculty of Engineering; 01. Izmir Institute of Technology
    In this study, the effects of surface dealkalization due to SO2 or SO3 gas treatment of commercial soda lime silica float glass on the weathering behavior was investigated. Only the air side of the glass was studied. The changes in the glass surface were analyzed for their topography and structure. The surface topography was studied using atomic force microscopy (AFM). The findings show the formation of micro-cracks on the surfaces of as-produced glass surfaces when treated with sulfur gas. The weathered surfaces show an increased roughness with increased weathering. The surface structure was investigated using attenuated total reflection-Fourier transform infrared (ATR-FTIR) spectroscopy, specular reflectance infrared (SR-IR) spectroscopy, and micro-Raman spectroscopy techniques The results of the studies, ATR-FTIR and SR-IR techniques provided a reasonable insight on the surface structural changes while micro-Raman spectroscopy failed to detects these differences. ATR-FTIR and SR-IR the overall comparison of the effects of peak position with and without sulfur gas treatment suggests a wide scatter within each group. This scatter implies that sulfur gas treatment does not have any statistically significant effects. Also, the change in peak positions are no clear evidence of a decreasing or increasing peak position as the weathering period is increased by weathering effect. Additionally, the calculated penetration depth is found to be ~0,6-1 μm for these techniques. Namely, the penetration depth greater than the surface modification was observed. The results showed was not significantly affected by the surface dealkalization and weathering reactions. The analysis of the surface topography using AFM technique showed the formation of micro-cracks like features on the surfaces of sulfur treated glasses. These features are thought to occur under the sodium sulfate salt residue that is formed during the high temperature dealkalization reactions on the surface. Results sample preparation, i.e. cleaning, was found to have a significant effect on the surface properties. A method has been developed to minimize the effects of sample preparation on the surface of the glass.
  • Master Thesis
    Development of Nanopatterns on Self Assembled Monolayer (sam) Organic Films Using Scanning Probe Microscope (spm) Nanolithography Techique
    (Izmir Institute of Technology, 2006) Gül, Semra; Okur, Salih; Okur, Salih; 04.05. Department of Pyhsics; 04. Faculty of Science; 01. Izmir Institute of Technology
    Patterning and fabrication of nanostructures on surfaces is a great demand for nanoscale electronic and mechanical devices. Current techniques such as electron beam lithography and photolithography provides limited resolution and they are not capable of reproducible in nanoscale. Among those, Scanning Probe Microscopy (SPM) lithography that uses a nanometer sharpened tip has demonstrated outstanding capabilities for nanometer level patterning on various surfaces. Moreover, SPM techniques offer creating nanopatterns of Self Assembled Monolayers (SAMs) with molecular precision and visualizing surfaces with the highest spatial resolution. In this work, nanoscratches on gold surfaces and oxidation patterns on titanium surface were successfully performed as example of SPM lithography. In the second stage, Octadecylamine-HCl, Octadecanetiol (ODT) and Decylmercaptan (DM) SAM organic films were fabricated on various substrates; i.e., mica, silica, titanium surface deposited on silicon, n and p type silicon, using self assembly film preparation techniques. The film thicknesses were measured with Atomic Force Microscope (AFM). Nanopatterns were fabricated on SAM films using AFM tip by exerting a local high pressure at the contact that causes the displacement of SAM molecules by a high shear force. It was observed that there was no formation of SAMs on n type Si and silica substrates whereas there were organic assemblies on the other substrates. Fabricated nanopatterns were examined and thickness measurement was done. Molecular lengths of the organics were evaluated by using of SPARTAM 02 LINUX-UNIX with the method of PM3 and the measured values were compared with the calculated ones and it was concluded that monolayers were formed on the surfaces.