WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

Permanent URI for this collectionhttps://hdl.handle.net/11147/7150

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  • Conference Object
    Citation - WoS: 1
    An Origami-Inspired Low-Cost Waveguide Design, Fabrication and Measurements for X-Band Satellite Communication Systems
    (IEEE, 2023) Karatay, Anıl; Ataç, Enes; Yaman, Fatih
    In many applications such as satellite communication, transmission lines are required and waveguides are widely used in these applications. This passive component, which is an indispensable element of microwave systems, is generally not suitable for practical and low-cost applications due to being produced from costly and heavy metals. Therefore, nowadays, the tendency to use low-cost, light and practical components has increased. In this study, origami-inspired waveguide design for X-band satellite communication systems is aimed. This component, which is formed by folding a paper into a three-dimensional structure and covering it with a conductive material, is both practical and fast to produce, portable and adjustable. The obtained simulation results match well with the experimental results, and it has been proven that the paper-based waveguide performs as well as the conventional aluminum waveguide. This makes the proposed method an innovative and cost-effective solution for waveguide fabrication.
  • Article
    Citation - WoS: 2
    Citation - Scopus: 2
    Subwavelength Thickness Characterization of Curved Dielectric Films Exploiting Spatially Structured Entangled Photons
    (Optica Publishing Group, 2023) Ataç, Enes; Dinleyici, Mehmet Salih
    Precise determination of thin dielectric film optical properties is a critical issue for fiber optic sensor technologies. However, conventional methods for the optical characterization of these films not only are generally complex and tedious processes on curved surfaces but also require well-calibrated and overly sophisticated devices. We, on the other hand, propose a novel and practical quantum-based phase diffraction scheme to characterize the thickness of ultra-thin transparent dielectric films coated on an optical fiber beyond the classical diffraction limits in this paper. The approach is implemented by evaluating the effect of thickness variations on the highly visible two-photon diffraction pattern's zero crossings and amplitudes. The mathematical model and numerical simulations con-tribute to a better understanding of how the spatially structured entangled photons improve thickness precision with the help of intensity correlations and a confocal aperture. To prove the impact of the proposed system, it is compared with the classical phase diffraction method in the literature via simulations. According to the results, the thickness of the transparent dielectric films can be accurately estimated below one-twentieth of the wavelength of interest. & COPY; 2023 Optica Publishing Group