Materials Science and Engineering / Malzeme Bilimi ve Mühendisliği

Permanent URI for this collectionhttps://hdl.handle.net/11147/4719

Browse

Filters

2014 - 20162

Settings

Subject: search.filters.subject.Surface roughness

Search Results

Now showing 1 - 2 of 2
  • Article
    Citation - WoS: 2
    Citation - Scopus: 2
    Surface Roughness Estimation of Mbe Grown Cdte/Gaas(211)b by Ex-Situ Spectroscopic Ellipsometry
    (American Institute of Physics, 2016) Karakaya, Merve; Bilgilisoy, Elif; Arı, Ozan; Selamet, Yusuf; Bilgilisoy, Elif; Selamet, Yusuf; Karakaya, Merve; 01. Izmir Institute of Technology; 04.05. Department of Pyhsics; 04. Faculty of Science
    Spectroscopic ellipsometry (SE) ranging from 1.24 eV to 5.05 eV is used to obtain the film thickness and optical properties of high index (211) CdTe films. A three-layer optical model (oxide/CdTe/GaAs) was chosen for the ex-situ ellipsometric data analysis. Surface roughness cannot be determined by the optical model if oxide is included. We show that roughness can be accurately estimated, without any optical model, by utilizing the correlation between SE data (namely the imaginary part of the dielectric function, <ϵ2 > or phase angle, ψ) and atomic force microscopy (AFM) roughness. <ϵ2 > and ψ values at 3.31 eV, which corresponds to E1 critical transition energy of CdTe band structure, are chosen for the correlation since E1 gives higher resolution than the other critical transition energies. On the other hand, due to the anisotropic characteristic of (211) oriented CdTe surfaces, SE data (<ϵ2 > and ψ) shows varieties for different azimuthal angle measurements. For this reason, in order to estimate the surface roughness by considering these correlations, it is shown that SE measurements need to be taken at the same surface azimuthal angle. Estimating surface roughness in this manner is an accurate way to eliminate cumbersome surface roughness measurement by AFM.
  • Article
    Citation - WoS: 4
    Citation - Scopus: 4
    Formation and Characterisation of Nanoporous Tio2 Layers on Microroughened Titanium Surfaces by Electrochemical Anodisation
    (Institution of Engineering and Technology, 2014) Dikici, Tuncay; Güzelaydın, Abdurrahman Halis; Toparlı, Mustafa; 01. Izmir Institute of Technology
    Nanoporous titanium dioxide (TiO2) layers were successfully formed by an electrochemical anodisation method on microroughened titanium (Ti) surfaces in fluoride containing aqueous electrolyte. Microroughened Ti surfaces were produced by sandblasting with Al2O3 particles of 50 μm in diameter and acid-etching in a blend of HCl/H2SO4 solution. The surface morphology, topography and chemical composition of the specimens were analysed by scanning electron microscopy, atomic force microscopy and X-ray photoelectron spectroscopy. The surface roughness and the wettability of treated Ti surfaces were measured using profilometry and a contact angle measurement system, respectively. With anodising of sandblasted-/acid etched surfaces, micrometre- and nanometre-scale textures on titanium specimens were created. Results showed that these developed nanoporous-microroughened surfaces exhibited lower contact angle values than the other treated Ti surfaces. The sandblasted/acid-etched/anodised Ti specimen had a surface morphology with distinctively formed hills and valleys and higher surface roughness than the other anodised specimens. This study indicated that nanoporous TiO2 structures fabricated on microroughened Ti can be an effective way to modify the titanium surfaces for the future development of implant applications.