Electrical - Electronic Engineering / Elektrik - Elektronik Mühendisliği
Permanent URI for this collectionhttps://hdl.handle.net/11147/11
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Conference Object Yapısal Aydınlatma Kullanarak Yüzeylerin Geometrik ve Yansıtıcılık Özelliklerinin Geri Çatımı(Institute of Electrical and Electronics Engineers Inc., 2015) Ozan, Şükrü; Gümüştekin, ŞevketIt is not possible to perform a robust and dense surface reconstruction for plain colored surfaces which have insufficient surface features, and for surfaces which have specularity effect because of the material nature by using traditional stereo imaging methods. The proposed surface scanner system in this work makes it possible to get a robust and dense surface reconstruction even for plain colored and/or semi glossy surfaces. Reflection properties of the surface material are also reconstructed to some extent by using the information gathered after scanning process. Moreover, the experimental results are shown.Article Citation - Scopus: 1Reconstruction of Geometrical and Reflection Properties of Surfaces by Using Structured Light Imaging Technique(Türkiye Klinikleri Journal of Medical Sciences, 2018) Ozan, Şükrü; Gümüştekin, ŞevketWhen a robust and dense surface reconstruction is aimed, structured light imaging techniques are usually much appreciated. In this paper we propose a method to reconstruct both geometrical and reflective properties of surfaces by using structured light imaging. We use a technique where a camera and a projector are both treated as viewing devices. They are calibrated in the same manner. Each visible point can be correctly located on both image planes without solving a correspondence problem; hence, a dense reconstruction can be obtained. Since both the camera and the projector are explicitly calibrated, lighting and viewing directions can be identified for each surface point. It is also possible to measure reflected radiance by using high dynamic range (HDR) images for each surface point. The lighting and viewing directions that are known after calibration are combined with the reflected radiance and the incoming irradiance measurements to determine the bidirectional reflectance distribution function (BRDF) values of the material at the reconstructed surface points. We illustrate the reconstruction of surface reflection properties of sample surfaces by fitting the Phong BRDF model to the BRDF measurements.