Computer Engineering / Bilgisayar Mühendisliği
Permanent URI for this collectionhttps://hdl.handle.net/11147/10
Browse
Search Results
Article Citation - Scopus: 1Model-Based Ideal Testing of Hardware Description Language (hdl) Programs(Springer, 2021) Kılınççeker, Onur; Türk, Ercüment; Belli, Fevzi; Challenger, MoharramAn ideal test is supposed to show not only the presence of bugs but also their absence. Based on the Fundamental Test Theory of Goodenough and Gerhart (IEEE Trans Softw Eng SE-1(2):156–173, 1975), this paper proposes an approach to model-based ideal testing of hardware description language (HDL) programs based on their behavioral model. Test sequences are generated from both original (fault-free) and mutant (faulty) models in the sense of positive and negative testing, forming a holistic test view. These test sequences are then executed on original (fault-free) and mutant (faulty) HDL programs, in the sense of mutation testing. Using the techniques known from automata theory, test selection criteria are developed and formally show that they fulfill the major requirements of Fundamental Test Theory, that is, reliability and validity. The current paper comprises a preparation step (consisting of the sub-steps model construction, model mutation, model conversion, and test generation) and a composition step (consisting of the sub-steps pre-selection and construction of Ideal test suites). All the steps are supported by a toolchain that is already implemented and is available online. To critically validate the proposed approach, three case studies (a sequence detector, a traffic light controller, and a RISC-V processor) are used and the strengths and weaknesses of the approach are discussed. The proposed approach achieves the highest mutation score in positive and negative testing for all case studies in comparison with two existing methods (regular expression-based test generation and context-based random test generation), using four different techniques.Article Citation - WoS: 9Citation - Scopus: 11Test Input Generation From Cause-Effect Graphs(Springer, 2021) Kavzak Ufuktepe, Deniz; Ayav, Tolga; Belli, FevziCause-effect graphing is a well-known requirement-based and systematic testing method with a heuristic approach. Since it was introduced by Myers in 1979, there have not been any sufficiently comprehensive studies to generate test inputs from these graphs. However, there exist several methods for test input generation from Boolean expressions. Cause-effect graphs can be more convenient for a wide variety of users compared to Boolean expressions. Moreover, they can be used to enforce common constraints and rules on the system variables of different expressions of the system. This study proposes a new mutant-based test input generation method, Spectral Testing for Boolean specification models based on spectral analysis of Boolean expressions using mutations of the original expression. Unlike Myers' method, Spectral Testing is an algorithmic and deterministic method, in which we model the possible faults systematically. Furthermore, the conversion of cause-effect graphs between Boolean expressions is explored so that the existing test input generation methods for Boolean expressions can be exploited for cause-effect graphing. A software is developed as an open-source extendable tool for generating test inputs from cause-effect graphs by using different methods and performing mutation analysis for quantitative evaluation on these methods for further analysis and comparison. Selected methods, MI, MAX-A, MUTP, MNFP, CUTPNFP, MUMCUT, Unique MC/DC, and Masking MC/DC are implemented together with Myers' technique and the proposed Spectral Testing in the developed tool. For mutation testing, 9 common fault types of Boolean expressions are modeled, implemented, and generated in the tool. An XML-based standard on top of GraphML representing a cause-effect graph is proposed and is used as the input type to the approach. An empirical study is performed by a case study on 5 different systems with various requirements, including the benchmark set from the TCAS-II system. Our results show that the proposed XML-based cause-effect graph model can be used to represent system requirements. The developed tool can be used for test input generation from proposed cause-effect graph models and can perform mutation analysis to distinguish between the methods with respect to the effectiveness of test inputs and their mutant kill scores. The proposed Spectral Testing method outperforms the state-of-the-art methods in the context of critical systems, regarding both the effectiveness and mutant kill scores of the generated test inputs, and increasing the chances of revealing faults in the system and reducing the cost of testing. Moreover, the proposed method can be used as a separate or complementary method to other well-performing test input generation methods for covering specific fault types.
