Effect of Electric Field on Interfacial Thermal Resistance Between Silicon and Water at Nanoscales

dc.contributor.author Yenigün, Onur
dc.contributor.author Barışık, Murat
dc.coverage.doi 10.11159/htff19.152
dc.date.accessioned 2020-07-18T03:35:17Z
dc.date.available 2020-07-18T03:35:17Z
dc.date.issued 2019
dc.description 5th World Congress on Mechanical, Chemical, and Material Engineering, MCM 2019 -- 15 August 2019 through 17 August 2019 en_US
dc.description.abstract In this study, heat transfer rate of a nano-confined liquid is controlled by applying an electric field parallel to the heat transfer direction. Molecular Dynamics simulations are performed for deionized water confined between silicon slabs, where their surfaces oppositely charged to create an electric field perpendicular to the silicon wall to promote the electrowetting. Electric field strengths used in this study are 0, 0.18 and 0.35 V/nm. To investigate the effect of electric field on heat transfer, first water density profiles near the silicon walls are examined. Results shows that by applying electric field, water molecules near the silicon walls develop layering, which indicates the increased solid/liquid coupling. With the increasing electric field strength, an increase in the peak of the density layering is observed. Furthermore, heat transfer at the solid/liquid interface is characterized with the Kapitza length values. The results show that applying electric field reduces the interfacial thermal resistance between water and silicon due to the increased solid/liquid coupling and doubles the total heat flux. © 2019, Avestia Publishing. en_US
dc.identifier.doi 10.11159/htff19.152 en_US
dc.identifier.doi 10.11159/htff19.152
dc.identifier.issn 2369-8136
dc.identifier.scopus 2-s2.0-85082666953
dc.identifier.uri https://doi.org/10.11159/htff19.152
dc.identifier.uri https://hdl.handle.net/11147/7854
dc.language.iso en en_US
dc.publisher Avestia Publishing en_US
dc.relation.ispartof Proceedings of the World Congress on Mechanical, Chemical, and Material Engineering en_US
dc.rights info:eu-repo/semantics/openAccess en_US
dc.subject Electrowetting en_US
dc.subject Interfacial thermal resistance en_US
dc.subject Kapitza length en_US
dc.subject MoLecular dynamics en_US
dc.title Effect of Electric Field on Interfacial Thermal Resistance Between Silicon and Water at Nanoscales en_US
dc.type Conference Object en_US
dspace.entity.type Publication
gdc.author.institutional Yenigün, Onur
gdc.author.institutional Barışık, Murat
gdc.bip.impulseclass C5
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gdc.coar.access open access
gdc.coar.type text::conference output
gdc.collaboration.industrial false
gdc.description.department İzmir Institute of Technology. Mechanical Engineering en_US
gdc.description.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality Q4
gdc.identifier.openalex W2965992698
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gdc.oaire.impulse 0.0
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gdc.oaire.keywords Kapitza length
gdc.oaire.keywords Electrowetting
gdc.oaire.keywords Interfacial thermal resistance
gdc.oaire.keywords MoLecular dynamics
gdc.oaire.popularity 1.464577E-9
gdc.oaire.publicfunded false
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