Software Product Line Testing Based on Event Sequence Graphs With Feature Expressions
| dc.contributor.author | Kaya, D.O. | |
| dc.contributor.author | Tuglular, T. | |
| dc.contributor.author | Belli, F. | |
| dc.date.accessioned | 2024-01-06T07:21:34Z | |
| dc.date.available | 2024-01-06T07:21:34Z | |
| dc.date.issued | 2023 | |
| dc.description | 8th International Conference on Computer Science and Engineering, UBMK 2023 -- 13 September 2023 through 15 September 2023 -- 193873 | en_US |
| dc.description.abstract | Software Product Line testing is by its nature challenging, especially due to the exponential rise in the number of assets that need to be verified. Scalability and efficient verification, two challenges that model-based SPL testing must deal with, are discussed in this paper. An approach to automatically obtaining test suites for software product lines is proposed as a solution to these challenges. By exploiting Event Sequence Graphs with Feature Expressions, which concisely depict the Software Product Line behavior, the proposed approach automatically generates test sequences for different product configurations. The presented approach is applied to the illustrative case studies from the literature. © 2023 IEEE. | en_US |
| dc.identifier.doi | 10.1109/UBMK59864.2023.10286660 | |
| dc.identifier.isbn | 9798350340815 | |
| dc.identifier.scopus | 2-s2.0-85177603151 | |
| dc.identifier.uri | https://doi.org/10.1109/UBMK59864.2023.10286660 | |
| dc.identifier.uri | https://hdl.handle.net/11147/14151 | |
| dc.language.iso | en | en_US |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | en_US |
| dc.relation.ispartof | UBMK 2023 - Proceedings: 8th International Conference on Computer Science and Engineering | en_US |
| dc.rights | info:eu-repo/semantics/closedAccess | en_US |
| dc.subject | event sequence graphs | en_US |
| dc.subject | feature expression | en_US |
| dc.subject | software product lines | en_US |
| dc.subject | Software design | en_US |
| dc.subject | Case-studies | en_US |
| dc.subject | Event sequence graphs | en_US |
| dc.subject | Exponentials | en_US |
| dc.subject | Feature expression | en_US |
| dc.subject | Model-based OPC | en_US |
| dc.subject | Product configuration | en_US |
| dc.subject | Software Product Line | en_US |
| dc.subject | Software product line testing | en_US |
| dc.subject | Test sequence | en_US |
| dc.subject | Software testing | en_US |
| dc.title | Software Product Line Testing Based on Event Sequence Graphs With Feature Expressions | en_US |
| dc.type | Conference Object | en_US |
| dspace.entity.type | Publication | |
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| gdc.coar.type | text::conference output | |
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| gdc.description.department | İzmir Institute of Technology | en_US |
| gdc.description.departmenttemp | Kaya, D.O., Izmir Institute of Technology, Department of Computer Engineering, Izmir, Turkey; Tuglular, T., Izmir Institute of Technology, Department of Computer Engineering, Izmir, Turkey; Belli, F., Paderborn University, Faculty of Computer Sci., Paderborn, Germany | en_US |
| gdc.description.endpage | 180 | en_US |
| gdc.description.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
| gdc.description.scopusquality | N/A | |
| gdc.description.startpage | 175 | en_US |
| gdc.description.wosquality | N/A | |
| gdc.identifier.openalex | W4387913025 | |
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