Towards Uniform Modeling and Holistic Testing of Hardware and Software

dc.contributor.author Kılınççeker, Onur
dc.contributor.author Belli, Fevzi
dc.coverage.doi 10.1109/UBMYK48245.2019.8965650
dc.date.accessioned 2020-07-18T03:35:15Z
dc.date.available 2020-07-18T03:35:15Z
dc.date.issued 2019
dc.description 1st International Informatics and Software Engineering Conference, IISEC 2019 -- 6 November 2019 through 7 November 2019 en_US
dc.description.abstract This paper introduces an approach to uniform modeling and testing of hardware and software systems and their faults. As an example, for hardware under consideration, designs at a behavioral level will be used, implemented in Hardware Description Language (HDL). For software, an example will be borrowed from a graphical user interface design. Both examples will be modeled by finite state machines. The mutation of these models leads to lucid hardware and software fault models, respectively. Original models and their mutants will then be used to generate test cases for positive testing and negative testing, respectively, forming a holistic test strategy. A positive test is supposed to validate the system under legal (expected, regular) circumstances, whereas a negative test checks the behavior of the system under illegal (unexpected, irregular) situations. Non-trivial examples are used to validate and analyze the approach with respect to uniform modeling and testing capability. © 2019 IEEE. en_US
dc.identifier.doi 10.1109/UBMYK48245.2019.8965650 en_US
dc.identifier.isbn 9781728139920
dc.identifier.scopus 2-s2.0-85079234053
dc.identifier.uri https://doi.org/10.1109/UBMYK48245.2019.8965650
dc.identifier.uri https://hdl.handle.net/11147/7839
dc.language.iso en en_US
dc.publisher Institute of Electrical and Electronics Engineers Inc. en_US
dc.relation.ispartof 1st International Informatics and Software Engineering Conference: Innovative Technologies for Digital Transformation, IISEC 2019 - Proceedings en_US
dc.rights info:eu-repo/semantics/openAccess en_US
dc.subject Finite state machine en_US
dc.subject Holistic testing en_US
dc.subject Mutation testing en_US
dc.subject Validation en_US
dc.title Towards Uniform Modeling and Holistic Testing of Hardware and Software en_US
dc.type Conference Object en_US
dspace.entity.type Publication
gdc.author.institutional Belli, Fevzi
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gdc.coar.access open access
gdc.coar.type text::conference output
gdc.collaboration.industrial false
gdc.description.department İzmir Institute of Technology. Computer Engineering en_US
gdc.description.endpage 6
gdc.description.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality N/A
gdc.description.startpage 1
gdc.description.wosquality N/A
gdc.identifier.openalex W3001569607
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gdc.oaire.downloads 37
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gdc.oaire.influence 2.8355622E-9
gdc.oaire.isgreen true
gdc.oaire.keywords System/Fault modeling
gdc.oaire.keywords Holistic Testing
gdc.oaire.keywords Mutation Testing
gdc.oaire.keywords Finite State Machine
gdc.oaire.keywords Validation
gdc.oaire.keywords Holistic testing
gdc.oaire.keywords System/Fault Modeling
gdc.oaire.keywords Mutation testing
gdc.oaire.keywords Finite state machine
gdc.oaire.popularity 3.431507E-9
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gdc.oaire.sciencefields 0202 electrical engineering, electronic engineering, information engineering
gdc.oaire.sciencefields 02 engineering and technology
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gdc.opencitations.count 3
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