Dependence of Josephson Junction Critical Current on the Deposition Rate of Yba2cu3o7-? Thin Films
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Date
2007
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Publisher
American Institute of Physics
Open Access Color
Green Open Access
Yes
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Abstract
We have reported the effect of YBa2Cu3O 7-δ (YBCO) thin film deposition rate on the 24 and 30 degree STO bicrystal Josephson junctions critical currents by fabricating series of junctions with different deposition rates. Dependence of YBCO thin film structures on the deposition rate was investigated. We have observed that the critical currents of junctions are strongly affected by the thin film deposition rate.
Description
6TH International Conference of the Balkan Physical Union; Istanbul; Turkey; 22 August 2006 through 26 August 2007
Keywords
Josephson junctions, Deposition rate, Deposition rate, Josephson junctions
Fields of Science
0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology, 01 natural sciences, 0104 chemical sciences
Citation
Algül, B. P., Avcı, İ., Akram, R., Bozbey, A., Tepe, M., and Abukay, D. (2007). Dependence of Josephson junction critical current on the deposition rate of YBa2Cu3O7-δ thin films. AIP Conference Proceedings, 899, 762. doi:10.1063/1.2733503
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N/A
Scopus Q
Q4
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AIP Conference Proceedings
Volume
899
Issue
Start Page
762
End Page
762
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