Model-Based Selective Layer-Centric Testing

dc.contributor.author Belli, Fevzi
dc.contributor.author Güler Dinçer, Nevin
dc.contributor.author Linschulte, Michael
dc.contributor.author Tuğlular, Tuğkan
dc.coverage.doi 10.2197/IPSJJIP.26.572
dc.date.accessioned 2020-07-18T03:35:20Z
dc.date.available 2020-07-18T03:35:20Z
dc.date.issued 2018
dc.description.abstract Model-based testing of large systems usually requires decomposition of the model into hierarchical submodels for generating test sequences, which fulfills the goals of module testing, but not those of system testing. System testing requires test sequences be generated from a fully resolved model, which necessitates refining the toplevel model, that is, by replacing its elements with submodels they represent. If the depth of model hierarchy is high, the number of test sequences along with their length increases resulting in high test costs. For solving this conflict, a novel approach is introduced that generates test sequences based on the top-level model and replaces elements of these sequences by corresponding, optimized test sequences generated by the submodels. To compensate the shortcoming at test accuracy, the present approach selects components that have lowering impact on the overall system reliability. The objective is to increase the reliabilities of these critical components by intensive testing and appropriate correction which, as a consequence, also increases the overall reliability at less test effort without losing accuracy. An empirical study based on a large web-based commercial system is performed to validate the approach and analyze its characteristics, and to discuss its strengths and weaknesses. © 2018 Information Processing Society of Japan. en_US
dc.identifier.doi 10.2197/IPSJJIP.26.572
dc.identifier.issn 0387-5806
dc.identifier.issn 1882-6652
dc.identifier.scopus 2-s2.0-85063625202
dc.identifier.uri https://doi.org/10.2197/IPSJJIP.26.572
dc.identifier.uri https://hdl.handle.net/11147/7895
dc.language.iso en en_US
dc.publisher Information Processing Society of Japan en_US
dc.relation.ispartof Journal of Information Processing en_US
dc.rights info:eu-repo/semantics/openAccess en_US
dc.subject Assignment problem en_US
dc.subject Chinese postman problem en_US
dc.subject Event sequence graphs en_US
dc.subject Model refinement en_US
dc.subject Model-based testing en_US
dc.subject Software reliability en_US
dc.title Model-Based Selective Layer-Centric Testing en_US
dc.type Article en_US
dspace.entity.type Publication
gdc.author.institutional Tuğlular, Tuğkan
gdc.author.institutional Belli, Fevzi
gdc.bip.impulseclass C5
gdc.bip.influenceclass C5
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gdc.coar.access open access
gdc.coar.type text::journal::journal article
gdc.collaboration.industrial false
gdc.description.department İzmir Institute of Technology. Computer Engineering en_US
gdc.description.endpage 589 en_US
gdc.description.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality Q4
gdc.description.startpage 572 en_US
gdc.description.volume 26 en_US
gdc.description.wosquality N/A
gdc.identifier.openalex W2891238066
gdc.index.type Scopus
gdc.oaire.accesstype GOLD
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gdc.oaire.downloads 0
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gdc.oaire.keywords Chinese postman problem
gdc.oaire.keywords Assignment problem
gdc.oaire.keywords Event sequence graphs
gdc.oaire.keywords Model refinement
gdc.oaire.keywords Software reliability
gdc.oaire.keywords Model-based testing
gdc.oaire.popularity 1.2792151E-9
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gdc.oaire.sciencefields 0202 electrical engineering, electronic engineering, information engineering
gdc.oaire.sciencefields 02 engineering and technology
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