Featured Event Sequence Graphs for Model-Based Incremental Testing of Software Product Lines

dc.contributor.author Tuğlular, Tuğkan
dc.contributor.author Beyazıt, Mutlu
dc.contributor.author Öztürk, Dilek
dc.coverage.doi 10.1109/COMPSAC.2019.00035
dc.date.accessioned 2020-07-25T22:10:44Z
dc.date.available 2020-07-25T22:10:44Z
dc.date.issued 2019
dc.description 43rd IEEE-Computer-Society Annual International Computers, Software and Applications Conference (COMPSAC) -- JUL 15-19, 2019 -- Marquette Univ, Milwaukee, WI en_US
dc.description.abstract The goal of software product lines (SPLs) is rapid development of high-quality software products in a specific domain with cost minimization. To assure quality of software products from SPLs, products need to be tested systematically. However, testing every product variant in isolation is generally not feasible for large number of product variants. An approach to deal with this issue is to use incremental testing, where test artifacts that are developed for one product are reused for another product which can be obtained by incrementally adding features to the prior product. We propose a novel model-based test generation approach for products developed using SPL that follows incremental testing paradigm. First, we introduce Featured Event Sequence Graphs (FESGs), an extension of ESGs, that provide necessary definitions and operations to support commonalities and variabilities in SPLs with respect to test models. Then we propose a test generation technique for the product variants of an SPL, which starts from any product. The proposed technique with FESGs avoids redundant test generation for each product from SPL. We compare our technique with in-isolation testing approach by a case study. en_US
dc.identifier.doi 10.1109/COMPSAC.2019.00035 en_US
dc.identifier.isbn 978-1-7281-2607-4
dc.identifier.issn 0730-3157
dc.identifier.scopus 2-s2.0-85072701249
dc.identifier.uri https://doi.org/10.1109/COMPSAC.2019.00035
dc.identifier.uri https://hdl.handle.net/11147/9386
dc.language.iso en en_US
dc.publisher IEEE en_US
dc.relation.ispartof 2019 IEEE 43rd Annual Computer Software and Applications Conference (COMPSAC) en_US
dc.relation.ispartofseries Proceedings International Computer Software and Applications Conference
dc.rights info:eu-repo/semantics/openAccess en_US
dc.subject Software product lines en_US
dc.subject Model-based testing en_US
dc.subject Incremental testing en_US
dc.subject Event Sequence graphs en_US
dc.title Featured Event Sequence Graphs for Model-Based Incremental Testing of Software Product Lines en_US
dc.type Conference Object en_US
dspace.entity.type Publication
gdc.author.id 0000-0001-6797-3913
gdc.author.institutional Tuğlular, Tuğkan
gdc.author.institutional Öztürk, Dilek
gdc.bip.impulseclass C5
gdc.bip.influenceclass C5
gdc.bip.popularityclass C4
gdc.coar.access open access
gdc.coar.type text::conference output
gdc.collaboration.industrial false
gdc.description.department İzmir Institute of Technology. Computer Engineering en_US
gdc.description.endpage 202 en_US
gdc.description.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality Q4
gdc.description.startpage 197 en_US
gdc.description.wosquality N/A
gdc.identifier.openalex W2957560894
gdc.identifier.wos WOS:000538791700025
gdc.index.type WoS
gdc.index.type Scopus
gdc.oaire.diamondjournal false
gdc.oaire.impulse 2.0
gdc.oaire.influence 2.9315614E-9
gdc.oaire.isgreen true
gdc.oaire.keywords Incremental testing
gdc.oaire.keywords Event sequence graphs
gdc.oaire.keywords Software product lines
gdc.oaire.keywords Model-based testing
gdc.oaire.popularity 7.06461E-9
gdc.oaire.publicfunded false
gdc.oaire.sciencefields 0202 electrical engineering, electronic engineering, information engineering
gdc.oaire.sciencefields 02 engineering and technology
gdc.openalex.collaboration National
gdc.openalex.fwci 0.30723549
gdc.openalex.normalizedpercentile 0.65
gdc.opencitations.count 6
gdc.plumx.crossrefcites 1
gdc.plumx.mendeley 8
gdc.plumx.scopuscites 5
gdc.scopus.citedcount 5
gdc.wos.citedcount 5
relation.isAuthorOfPublication.latestForDiscovery 607b0df0-2223-414c-a54f-71a21f919fda
relation.isOrgUnitOfPublication.latestForDiscovery 9af2b05f-28ac-4014-8abe-a4dfe192da5e

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