A Knowledge-Driven Computer Vision Framework for Automated Atomic Force Microscopy Surface Characterization

Abstract

This study presents an innovative analytical framework developed to automate Atomic Force Microscopy (AFM)-based surface characterization. The proposed methodology integrates computer vision (CV) algorithms and machine learning (ML) techniques to overcome the limitations of conventional observer-dependent approaches and visual inspection methods. In the first stage of the two-step data processing pipeline, raw AFM signals were converted into structured datasets, correspondences between images acquired under different loading conditions were identified, and drift effects in both direction and magnitude were predicted using a LightGBM-based machine learning (ML) model to guide subsequent analytical processes. This process establishes a unified coordinate reference across varying force levels, enabling pixel-level comparability of surface maps. In the second stage, the aligned datasets are systematically analyzed through block-based local maxima detection, edge-based contour extraction, morphological filtering, and skeletonization algorithms. In this way, ridge-like surface features are reliably identified and quantitatively evaluated along their axes under varying force conditions. The framework ensures data integrity while enabling high-resolution and reproducible analyzes. Beyond its automation capability, it is distinguished by its integrated, modular architecture, where each component operates sequentially along a unified processing pipeline. The methodology was validated using epitaxial monolayer graphene grown on the C-face of SiC, successfully demonstrating its ability to resolve both geometric and force-dependent mechanical responses. In this regard, the proposed system extends beyond conventional cross-sectional analysis by providing a drift-aware, knowledge-guided compensation mechanism and directionally resolved evaluation, offering a robust, automation-ready infrastructure for nanoscale surface characterization.