Automatic Test Sequence Generation and Functional Coverage Measurement From Uml Sequence Diagrams

dc.contributor.author Ekici, Nazim Umut
dc.contributor.author Tuglular, Tugkan
dc.date.accessioned 2024-01-06T07:21:31Z
dc.date.available 2024-01-06T07:21:31Z
dc.date.issued 2023
dc.description Tuglular, Tugkan/0000-0001-6797-3913 en_US
dc.description.abstract Sequence diagrams define functional requirements through use cases. However, their visual form limits their usability in the later stages of the development life cycle. This work proposes a method to transform sequence diagrams into graph-based event sequence graphs, allowing the application of graph analysis methods and defining graph-based coverage criteria. This work explores these newfound abilities in two directions. The first is to use coverage criteria along with existing tests to measure their coverage levels, providing a metric of how well they address the scenarios defined in sequence diagrams. The second is to use coverage criteria to automatically generate effective and efficient acceptance test cases based on the scenarios defined in sequence diagrams. The transformation method is validated with over eighty non-trivial projects. The complete method is validated through a non-trivial example. The results show that the test cases generated with the proposed method are more effective at exposing faults and more efficient in test input size than user-generated test cases. en_US
dc.description.sponsorship TOOL SUPPORT en_US
dc.description.sponsorship TOOL SUPPORT en_US
dc.identifier.doi 10.4018/IJISMD.332865
dc.identifier.issn 1947-8186
dc.identifier.issn 1947-8194
dc.identifier.scopus 2-s2.0-85175828767
dc.identifier.uri https://doi.org/10.4018/IJISMD.332865
dc.identifier.uri https://hdl.handle.net/11147/14143
dc.language.iso en en_US
dc.publisher Igi Global en_US
dc.relation.ispartof International Journal of Information System Modeling and Design en_US
dc.rights info:eu-repo/semantics/openAccess en_US
dc.subject Acceptance Testing en_US
dc.subject Event Sequence Diagram en_US
dc.subject Functional Coverage en_US
dc.subject Sequence Diagram en_US
dc.subject Test Case Generation en_US
dc.title Automatic Test Sequence Generation and Functional Coverage Measurement From Uml Sequence Diagrams en_US
dc.type Article en_US
dspace.entity.type Publication
gdc.author.id 0000-0001-6797-3913
gdc.author.id Tuglular, Tugkan/0000-0001-6797-3913
gdc.author.id 0000-0001-6797-3913 en_US
gdc.author.id Tuglular, Tugkan / 0000-0001-6797-3913 en_US
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gdc.bip.impulseclass C5
gdc.bip.influenceclass C5
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gdc.coar.access open access
gdc.coar.type text::journal::journal article
gdc.collaboration.industrial false
gdc.description.department Izmir Institute of Technology en_US
gdc.description.departmenttemp [Ekici, Nazim Umut] Izmir Inst Technol, Computer Engn, Izmir, Turkiye; [Tuglular, Tugkan] Izmir Inst Technol, Izmir, Turkiye en_US
gdc.description.endpage 21
gdc.description.issue 1 en_US
gdc.description.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality Q2
gdc.description.startpage 1
gdc.description.volume 14 en_US
gdc.description.woscitationindex Emerging Sources Citation Index
gdc.description.wosquality Q4
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gdc.oaire.sciencefields 0202 electrical engineering, electronic engineering, information engineering
gdc.oaire.sciencefields 0102 computer and information sciences
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gdc.oaire.sciencefields 01 natural sciences
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