Prioritizing Mcdc Test Cases by Spectral Analysis of Boolean Functions
| dc.contributor.author | Ayav, Tolga | |
| dc.coverage.doi | 10.1002/stvr.1641 | |
| dc.date.accessioned | 2017-08-10T07:38:56Z | |
| dc.date.available | 2017-08-10T07:38:56Z | |
| dc.date.issued | 2017 | |
| dc.description.abstract | Test case prioritization aims at scheduling test cases in an order that improves some performance goal. One performance goal is a measure of how quickly faults are detected. Such prioritization can be performed by exploiting the Fault Exposing Potential (FEP) parameters associated to the test cases. FEP is usually approximated by mutation analysis under certain fault assumptions. Although this technique is effective, it could be relatively expensive compared to the other prioritization techniques. This study proposes a cost-effective FEP approximation for prioritizing Modified Condition Decision Coverage (MCDC) test cases. A strict negative correlation between the FEP of a MCDC test case and the influence value of the associated input condition allows to order the test cases easily without the need of an extensive mutation analysis. The method is entirely based on mathematics and it provides useful insight into how spectral analysis of Boolean functions can benefit software testing. | en_US |
| dc.identifier.citation | Ayav, T. (2017). Prioritizing MCDC test cases by spectral analysis of Boolean functions. Software Testing, Verification and Reliability. doi:10.1002/stvr.1641 | en_US |
| dc.identifier.doi | 10.1002/stvr.1641 | en_US |
| dc.identifier.doi | 10.1002/stvr.1641 | |
| dc.identifier.issn | 0960-0833 | |
| dc.identifier.issn | 1099-1689 | |
| dc.identifier.scopus | 2-s2.0-85026497025 | |
| dc.identifier.uri | http://doi.org/10.1002/stvr.1641 | |
| dc.identifier.uri | https://hdl.handle.net/11147/6065 | |
| dc.language.iso | en | en_US |
| dc.publisher | John Wiley and Sons Inc. | en_US |
| dc.relation.ispartof | Software Testing Verification and Reliability | en_US |
| dc.rights | info:eu-repo/semantics/openAccess | en_US |
| dc.subject | Test prioritization | en_US |
| dc.subject | MCDC | en_US |
| dc.subject | Boolean functions | en_US |
| dc.subject | Spectral analysis | en_US |
| dc.subject | Mutation analysis | en_US |
| dc.title | Prioritizing Mcdc Test Cases by Spectral Analysis of Boolean Functions | en_US |
| dc.type | Article | en_US |
| dspace.entity.type | Publication | |
| gdc.author.institutional | Ayav, Tolga | |
| gdc.author.yokid | 114453 | |
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| gdc.coar.access | open access | |
| gdc.coar.type | text::journal::journal article | |
| gdc.collaboration.industrial | false | |
| gdc.description.department | İzmir Institute of Technology. Computer Engineering | en_US |
| gdc.description.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
| gdc.description.scopusquality | Q2 | |
| gdc.description.volume | 27 | |
| gdc.description.wosquality | Q4 | |
| gdc.identifier.openalex | W2741879058 | |
| gdc.identifier.wos | WOS:000417437200003 | |
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| gdc.oaire.influence | 2.958765E-9 | |
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| gdc.oaire.keywords | Mutation analysis | |
| gdc.oaire.keywords | MCDC | |
| gdc.oaire.keywords | Spectral analysis | |
| gdc.oaire.keywords | Boolean functions | |
| gdc.oaire.keywords | Test prioritization | |
| gdc.oaire.popularity | 4.905552E-9 | |
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| gdc.oaire.sciencefields | 0202 electrical engineering, electronic engineering, information engineering | |
| gdc.oaire.sciencefields | 02 engineering and technology | |
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