Monitoring the Characteristic Properties of Ga-Doped Zno by Raman Spectroscopy and Atomic Scale Calculations

dc.contributor.author Horzum, Şeyda
dc.contributor.author İyikanat, Fadıl
dc.contributor.author Senger, Ramazan Tuğrul
dc.contributor.author Çelebi, Cem
dc.contributor.author Sbeta, Mohamed
dc.contributor.author Yıldız, Abdullah
dc.contributor.author Serin, Tülay
dc.coverage.doi 10.1016/j.molstruc.2018.11.064
dc.date.accessioned 2020-07-25T22:03:29Z
dc.date.available 2020-07-25T22:03:29Z
dc.date.issued 2019
dc.description.abstract We experimentally and theoretically study how the structural and vibrational properties of zinc oxide (ZnO) are modified upon Gallium (Ga) doping. The characteristics of Ga-doped ZnO thin films which are synthesized by sol-gel spin coating method on glass substrates are monitored by using X-ray diffraction (XRD) and Raman scattering measurements. For atomic-level understanding of the experimental findings state-of-the-art density functional theory (DFT) based calculations are also performed. DFT calculations reveal that both the substitution and adsorption of Ga atoms in ZnO are energetically possible and substitutional doping in ZnO is the most favourable scenario. XRD measurements show that all the films are in wurtzite structure and the crystallite size of the films decreases with increasing Ga doping. In addition, Raman analysis show that strong vibrational modes at about 100 and 441 cm(-1) are associated with E-2(low) and E-2(high) phonon branches of ZnO, respectively. While the frequency of the E-2(low) mode downshifts with increasing Ga concentration, the E-2(high) phonon mode is not affected by the Ga doping. Furthermore, E-Ga phonon branch, stemming from the substituted Ga atoms, emerges at low frequencies. It is also seen that the Raman intensity of the E-G(a) peak linearly increases with increasing Ga concentration. Experimental results on the vibrational properties are in good agreement with the ab initio phonon calculations. (C) 2018 Elsevier B.V. All rights reserved. en_US
dc.identifier.doi 10.1016/j.molstruc.2018.11.064
dc.identifier.issn 0022-2860
dc.identifier.issn 1872-8014
dc.identifier.scopus 2-s2.0-85058228457
dc.identifier.uri https://doi.org/10.1016/j.molstruc.2018.11.064
dc.identifier.uri https://hdl.handle.net/11147/9080
dc.language.iso en en_US
dc.publisher Elsevier en_US
dc.relation.ispartof Journal of Molecular Structure en_US
dc.rights info:eu-repo/semantics/openAccess en_US
dc.subject Thin films en_US
dc.subject Ga-doped ZnO en_US
dc.subject Raman spectroscopy en_US
dc.subject XRD en_US
dc.subject ab initio en_US
dc.title Monitoring the Characteristic Properties of Ga-Doped Zno by Raman Spectroscopy and Atomic Scale Calculations en_US
dc.type Article en_US
dspace.entity.type Publication
gdc.author.institutional Horzum, Şeyda
gdc.author.institutional İyikanat, Fadıl
gdc.author.institutional Senger, Ramazan Tuğrul
gdc.author.institutional Çelebi, Cem
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gdc.coar.access open access
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gdc.description.department İzmir Institute of Technology. Physics en_US
gdc.description.endpage 511 en_US
gdc.description.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality Q1
gdc.description.startpage 505 en_US
gdc.description.volume 1180 en_US
gdc.description.wosquality Q2
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gdc.opencitations.count 45
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