Avoidance of Feature Configuration Faults in Software Product Lines

dc.contributor.author Ergun, Burcu
dc.contributor.author Tuglular, Tugkan
dc.contributor.author Belli, Fevzi
dc.date.accessioned 2025-10-25T17:44:18Z
dc.date.available 2025-10-25T17:44:18Z
dc.date.issued 2025
dc.description.abstract This paper presents a validation approach to feature selection in software product lines (SPL). SPLs consist of similar products tailored to different needs, while SPLs sharing a common platform where feature configurations define product families. Validating feature configurations is critical to avoid defective shipments, recalls, and disposal. Exhaustive, pairwise, and combinatorial testing, among others, aim at ensuring configuration correctness. This paper introduces a novel method for improving feature selection and validation in SPLs by minimizing redundancy while ensuring configurations align with customer needs. The method emphasizes uncovering the differences in feature structures through "complex" and "simple" models, which helps identify and helps identify and tolerate potential errors arising from incorrect feature configurations. This ensures broader coverage while effectively managing dependencies. A case study using the Access Point (AP) SPL model, which is a networking device designed to enhance the strength of an existing wireless signal and expand its coverage area. The AP can enable or disable specific features on AP SPL depending on the characteristics of the third-party gateway with which it is integrated. AP SPL model with 66 features lead to 266 configurations, generated by Exhaustive Testing. Pairwise testing achieves 87% coverage with 132 test cases, while combinatorial testing reaches 94% with 45,760 cases. Our method ensures 100% feature coverage with just 3 test configurations. Thus, the approach introduced in this paper enhances product quality while reducing costs by avoiding redundant tests, making the approaches valuable for large-scale SPLs. en_US
dc.identifier.doi 10.1109/COMPSAC65507.2025.00179
dc.identifier.isbn 9798331574352
dc.identifier.isbn 9798331574345
dc.identifier.issn 2836-3787
dc.identifier.scopus 2-s2.0-105016154821
dc.identifier.uri https://doi.org/10.1109/COMPSAC65507.2025.00179
dc.language.iso en en_US
dc.publisher IEEE Computer Soc en_US
dc.relation.ispartof 49th Computers, Software and Applications Conference-COMPSAC -- Jul 08-11, 2025 -- Toronto, Canada en_US
dc.relation.ispartofseries IEEE Annual International Computer Software and Applications Conference
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.subject Software Product Lines en_US
dc.subject Feature Selection en_US
dc.subject Test Redundancy Reduction en_US
dc.subject Quality Assurance en_US
dc.title Avoidance of Feature Configuration Faults in Software Product Lines
dc.title Avoidance of Feature Configuration Faults in Software Product Lines en_US
dc.type Conference Object en_US
dspace.entity.type Publication
gdc.author.institutional Tuğlular, Tuğkan
gdc.author.institutional Belli, Fevzi
gdc.author.scopusid 57196405044
gdc.author.scopusid 14627984700
gdc.author.scopusid 57200611344
gdc.author.wosid Tuglular, Tugkan/Aai-8008-2020
gdc.coar.type text::conference output
gdc.collaboration.industrial false
gdc.description.department İzmir Institute of Technology en_US
gdc.description.departmenttemp [Ergun, Burcu] Izmir Inst Technol, AirTies Wireless Networks, Izmir, Turkiye; [Tuglular, Tugkan] Izmir Inst Technol, Izmir, Turkiye; [Belli, Fevzi] Univ Paderborn, Izmir Inst Technol, Paderborn, Germany en_US
gdc.description.endpage 1436 en_US
gdc.description.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality N/A
gdc.description.startpage 1427 en_US
gdc.description.woscitationindex Conference Proceedings Citation Index - Science
gdc.description.wosquality N/A
gdc.identifier.openalex W4413679927
gdc.identifier.wos WOS:001575960000172
gdc.index.type WoS
gdc.index.type Scopus
gdc.openalex.collaboration International
gdc.openalex.fwci 0.0
gdc.openalex.normalizedpercentile 0.14
gdc.openalex.toppercent TOP 10%
gdc.opencitations.count 0
gdc.plumx.scopuscites 0
gdc.scopus.citedcount 0
gdc.wos.citedcount 0
relation.isAuthorOfPublication.latestForDiscovery 7f52fb71-3121-46a6-a461-2ff1b28d9fa1
relation.isOrgUnitOfPublication.latestForDiscovery 9af2b05f-28ac-4003-8abe-a4dfe192da5e

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