Model-Based Higher-Order Mutation Analysis
| dc.contributor.author | Belli, Fevzi | |
| dc.contributor.author | Güler, Nevin | |
| dc.contributor.author | Hollmann, Axel | |
| dc.contributor.author | Suna, Gökhan | |
| dc.contributor.author | Yıldız, Esra | |
| dc.coverage.doi | 10.1007/978-3-642-17578-7_17 | |
| dc.date.accessioned | 2016-12-09T14:01:58Z | |
| dc.date.available | 2016-12-09T14:01:58Z | |
| dc.date.issued | 2010 | |
| dc.description | International Conference on Advanced Software Engineering and Its Applications, ASEA 2010; Jeju Island; South Korea; 13 December 2010 through 15 December 2010 | en_US |
| dc.description.abstract | Mutation analysis is widely used as an implementation-oriented method for software testing and test adequacy assessment. It is based on creating different versions of the software by seeding faults into its source code and constructing test cases to reveal these changes. However, in case that source code of software is not available, mutation analysis is not applicable. In such cases, the approach introduced in this paper suggests the alternative use of a model of the software under test. The objectives of this approach are (i) introduction of a new technique for first-order and higher-order mutation analysis using two basic mutation operators on graph-based models, (ii) comparison of the fault detection ability of first-order and higher-order mutants, and (iii) validity assessment of the coupling effect. © 2010 Springer-Verlag Berlin Heidelberg. | en_US |
| dc.identifier.citation | Belli, F., Güler, N., Hollmann, A., Suna, G., and Yıldız, E. (2010). Model-based higher-order mutation analysis. Communications in Computer and Information Science, 117 CCIS, 164-173. doi:10.1007/978-3-642-17578-7_17 | en_US |
| dc.identifier.doi | 10.1007/978-3-642-17578-7_17 | |
| dc.identifier.doi | 10.1007/978-3-642-17578-7_17 | en_US |
| dc.identifier.isbn | 9783642175770 | |
| dc.identifier.issn | 1865-0929 | |
| dc.identifier.scopus | 2-s2.0-78651106224 | |
| dc.identifier.uri | http://doi.org/10.1007/978-3-642-17578-7_17 | |
| dc.identifier.uri | https://hdl.handle.net/11147/2596 | |
| dc.language.iso | en | en_US |
| dc.publisher | Springer Verlag | en_US |
| dc.relation.ispartof | Communications in Computer and Information Science | en_US |
| dc.rights | info:eu-repo/semantics/openAccess | en_US |
| dc.subject | Software testing | en_US |
| dc.subject | Basic mutation operators | en_US |
| dc.subject | Coupling effect | en_US |
| dc.subject | Event Sequence graphs | en_US |
| dc.title | Model-Based Higher-Order Mutation Analysis | en_US |
| dc.type | Conference Object | en_US |
| dspace.entity.type | Publication | |
| gdc.author.institutional | Suna, Gökhan | |
| gdc.author.institutional | Yıldız, Esra | |
| gdc.author.institutional | Belli, Fevzi | |
| gdc.bip.impulseclass | C5 | |
| gdc.bip.influenceclass | C5 | |
| gdc.bip.popularityclass | C5 | |
| gdc.coar.access | open access | |
| gdc.coar.type | text::conference output | |
| gdc.collaboration.industrial | false | |
| gdc.description.department | İzmir Institute of Technology. Computer Engineering | en_US |
| gdc.description.endpage | 173 | en_US |
| gdc.description.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
| gdc.description.scopusquality | Q4 | |
| gdc.description.startpage | 164 | en_US |
| gdc.description.volume | 117 CCIS | en_US |
| gdc.description.wosquality | N/A | |
| gdc.identifier.openalex | W1566513467 | |
| gdc.identifier.wos | WOS:000288402400017 | |
| gdc.index.type | WoS | |
| gdc.index.type | Scopus | |
| gdc.oaire.diamondjournal | false | |
| gdc.oaire.impulse | 2.0 | |
| gdc.oaire.influence | 3.2824616E-9 | |
| gdc.oaire.isgreen | true | |
| gdc.oaire.keywords | Coupling effect | |
| gdc.oaire.keywords | Event Sequence graphs | |
| gdc.oaire.keywords | Basic mutation operators | |
| gdc.oaire.keywords | Software testing | |
| gdc.oaire.popularity | 2.8168812E-9 | |
| gdc.oaire.publicfunded | false | |
| gdc.oaire.sciencefields | 0202 electrical engineering, electronic engineering, information engineering | |
| gdc.oaire.sciencefields | 02 engineering and technology | |
| gdc.openalex.collaboration | International | |
| gdc.openalex.fwci | 0.31755073 | |
| gdc.openalex.normalizedpercentile | 0.56 | |
| gdc.opencitations.count | 8 | |
| gdc.plumx.crossrefcites | 2 | |
| gdc.plumx.mendeley | 5 | |
| gdc.plumx.scopuscites | 10 | |
| gdc.scopus.citedcount | 10 | |
| gdc.wos.citedcount | 8 | |
| relation.isAuthorOfPublication.latestForDiscovery | 0f216971-d901-422e-9020-40f6636ca9ac | |
| relation.isOrgUnitOfPublication.latestForDiscovery | 9af2b05f-28ac-4014-8abe-a4dfe192da5e |
