Speckle Intensity Correlation Distribution Analysis Based on Coincidence Detection for Scattering Medium Characterization

dc.contributor.author Yoldas, Cansu
dc.contributor.author Kisa, Alperen
dc.contributor.author Atac, Enes
dc.contributor.author Karatay, Anil
dc.contributor.author Dinleyici, Mehmet Salih
dc.date.accessioned 2026-01-25T16:29:41Z
dc.date.available 2026-01-25T16:29:41Z
dc.date.issued 2025
dc.description.abstract Characterizing a scattering medium is essential for understanding and controlling light propagation, enabling accurate imaging, correlation analysis, and material diagnostics in scientific applications. In this study, the scattering medium has been characterized by examining the spatial distribution of the second-order temporal correlation function of varying speckle patterns obtained under faint-light conditions using a charge-coupled device (CCD) camera. In the proposed method, the exposure time has been utilized as a self-coincidence circuit of the CCD. The spatial statistics of second-order temporal autocorrelation values have been analyzed through power spectral density and radial spatial autocorrelation function. The scattering degree of the medium has been determined using our proposed autocorrelation-based metric. The results from three different media have shown that the method is effective and holds potential for applications such as characterization through speckle imaging. en_US
dc.identifier.doi 10.1109/SIU66497.2025.11111806
dc.identifier.isbn 9798331566562
dc.identifier.isbn 9798331566555
dc.identifier.issn 2165-0608
dc.identifier.uri https://doi.org/10.1109/SIU66497.2025.11111806
dc.identifier.uri https://hdl.handle.net/11147/18845
dc.language.iso tr en_US
dc.publisher IEEE en_US
dc.relation.ispartof 33rd Conference on Signal Processing and Communications Applications-SIU-Annual -- Jun 25-28, 2025 -- Istanbul, Turkiye en_US
dc.relation.ispartofseries Signal Processing and Communications Applications Conference
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.subject Speckle Pattern en_US
dc.subject Spatial Autocorrelation en_US
dc.subject Exposure Time en_US
dc.subject Scattering Medium en_US
dc.subject Temporal Correlation Function en_US
dc.title Speckle Intensity Correlation Distribution Analysis Based on Coincidence Detection for Scattering Medium Characterization en_US
dc.type Conference Object en_US
dspace.entity.type Publication
gdc.author.wosid Karatay, Anıl/Aaf-5015-2020
gdc.author.wosid Ataç, Enes/Aag-3803-2021
gdc.collaboration.industrial true
gdc.description.department İzmir Institute of Technology en_US
gdc.description.departmenttemp [Yoldas, Cansu; Kisa, Alperen; Atac, Enes; Karatay, Anil; Dinleyici, Mehmet Salih] Izmir Yuksek Teknol Enstitusu, Elekt Elekt Muhendisligi Bolumu, Izmir, Turkiye en_US
gdc.description.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality N/A
gdc.description.woscitationindex Conference Proceedings Citation Index - Science
gdc.description.wosquality N/A
gdc.identifier.openalex W7076053945
gdc.identifier.wos WOS:001575462500034
gdc.index.type WoS
gdc.openalex.collaboration International
gdc.openalex.fwci 0.0
gdc.openalex.normalizedpercentile 0.46
gdc.opencitations.count 0
gdc.plumx.scopuscites 0
gdc.wos.citedcount 0
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relation.isOrgUnitOfPublication.latestForDiscovery 9af2b05f-28ac-4018-8abe-a4dfe192da5e

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