Model-Based Mutation Testing-Approach and Case Studies

dc.contributor.author Belli, Fevzi
dc.contributor.author Budnik, Christof J.
dc.contributor.author Hollmann, Axel
dc.contributor.author Tuğlular, Tuğkan
dc.contributor.author Wong, W. Eric
dc.coverage.doi 10.1016/j.scico.2016.01.003
dc.date.accessioned 2017-04-28T11:40:32Z
dc.date.available 2017-04-28T11:40:32Z
dc.date.issued 2016
dc.description.abstract This paper rigorously introduces the concept of model-based mutation testing (MBMT) and positions it in the landscape of mutation testing. Two elementary mutation operators, insertion and omission, are exemplarily applied to a hierarchy of graph-based models of increasing expressive power including directed graphs, event sequence graphs, finite-state machines and statecharts. Test cases generated based on the mutated models (mutants) are used to determine not only whether each mutant can be killed but also whether there are any faults in the corresponding system under consideration (SUC) developed based on the original model. Novelties of our approach are: (1) evaluation of the fault detection capability (in terms of revealing faults in the SUC) of test sets generated based on the mutated models, and (2) superseding of the great variety of existing mutation operators by iterations and combinations of the two proposed elementary operators. Three case studies were conducted on industrial and commercial real-life systems to demonstrate the feasibility of using the proposed MBMT approach in detecting faults in SUC, and to analyze its characteristic features. Our experimental data suggest that test sets generated based on the mutated models created by insertion operators are more effective in revealing faults in SUC than those generated by omission operators. Worth noting is that test sets following the MBMT approach were able to detect faults in the systems that were tested by manufacturers and independent testing organizations before they were released. © 2016 Elsevier B.V. en_US
dc.identifier.citation Belli, F., Budnik, C. J., Hollmann, A., Tuğlular, T., and Wong, W. E. (2016). Model-based mutation testing-Approach and case studies. Science of Computer Programming, 120, 25-48. doi:10.1016/j.scico.2016.01.003 en_US
dc.identifier.doi 10.1016/j.scico.2016.01.003 en_US
dc.identifier.doi 10.1016/j.scico.2016.01.003
dc.identifier.issn 0167-6423
dc.identifier.scopus 2-s2.0-84956598573
dc.identifier.uri http://doi.org/10.1016/j.scico.2016.01.003
dc.identifier.uri https://hdl.handle.net/11147/5434
dc.language.iso en en_US
dc.publisher Elsevier Ltd. en_US
dc.relation.ispartof Science of Computer Programming en_US
dc.rights info:eu-repo/semantics/openAccess en_US
dc.subject Fault detection en_US
dc.subject Model-based mutation testing en_US
dc.subject Mutation operator en_US
dc.subject Software testing en_US
dc.title Model-Based Mutation Testing-Approach and Case Studies en_US
dc.type Article en_US
dspace.entity.type Publication
gdc.author.institutional Belli, Fevzi
gdc.author.institutional Tuğlular, Tuğkan
gdc.author.yokid 114656
gdc.bip.impulseclass C4
gdc.bip.influenceclass C4
gdc.bip.popularityclass C4
gdc.coar.access open access
gdc.coar.type text::journal::journal article
gdc.collaboration.industrial true
gdc.description.department İzmir Institute of Technology. Computer Engineering en_US
gdc.description.endpage 48 en_US
gdc.description.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality Q3
gdc.description.startpage 25 en_US
gdc.description.volume 120 en_US
gdc.description.wosquality Q3
gdc.identifier.openalex W2281922300
gdc.identifier.wos WOS:000372693400002
gdc.index.type WoS
gdc.index.type Scopus
gdc.oaire.accesstype HYBRID
gdc.oaire.diamondjournal false
gdc.oaire.impulse 20.0
gdc.oaire.influence 6.2047283E-9
gdc.oaire.isgreen true
gdc.oaire.keywords Mutation operator
gdc.oaire.keywords Model-based mutation testing
gdc.oaire.keywords Fault detection
gdc.oaire.keywords Software testing
gdc.oaire.popularity 2.4964901E-8
gdc.oaire.publicfunded false
gdc.oaire.sciencefields 0202 electrical engineering, electronic engineering, information engineering
gdc.oaire.sciencefields 02 engineering and technology
gdc.openalex.collaboration International
gdc.openalex.fwci 8.63747811
gdc.openalex.normalizedpercentile 0.98
gdc.openalex.toppercent TOP 10%
gdc.opencitations.count 52
gdc.plumx.crossrefcites 17
gdc.plumx.mendeley 76
gdc.plumx.scopuscites 76
gdc.scopus.citedcount 76
gdc.wos.citedcount 53
local.message.claim 2022-06-03T14:18:35.596+0300 *
local.message.claim |rp00375 *
local.message.claim |submit_approve *
local.message.claim |dc_contributor_author *
local.message.claim |None *
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