Light-Induced Modification of the Schottky Barrier Height in Graphene/Si Based Near-Infrared Photodiodes

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Abstract

The impact of light on the Schottky barrier height (SBH) in p-type graphene/n-type Si (p-Gr/n-Si) based near-infrared photodiodes is investigated. Hall effect and optoelectronic transport measurements carried out under illumination of 905 nm wavelength light showed that zero-bias SBH in such photodiodes can be effectively tuned in a range between 0.7 and 0.9 eV consistent with the variation in their open-circuit voltage. Shockley-Read-Hall model, which considers the charge recombination through mid-gap and interface states at the p-Gr/n-Si heterojunction, is used to explain the experimentally observed nonlinear dependence of SBH on the incident light. Light induced tunability of SBH at the graphene/semiconductor heterojunction is of great importance especially for the development of new generation optically driven devices in which graphene acts as a functioning element.

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Schottky photodiode, CVD graphene, Near-infrared photodiode, Open-circuit voltage, Silicon, Near-Infrared Photodiode, CVD Graphene, Incident Light, Near-Infrared Photodiodes, Schottky Barriers, Shockley-Read-Hall Recombination, Photodiodes, Open-Circuit Voltage, Schottky Barrier Diodes, Infrared Devices, Transport Measurements, Light-Induced, Shockley-Read-Hall Recombinations, Open-Circuit Voltages, Timing Circuits, Interface States, Schottky-Barrier Heights, Schottky Barrier, Heterojunctions, Graphene, Open Circuit Voltage, P-Type, Si-Based

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02 engineering and technology, 01 natural sciences, 0103 physical sciences, 0210 nano-technology

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123

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