Electrical - Electronic Engineering / Elektrik - Elektronik Mühendisliği

Permanent URI for this collectionhttps://hdl.handle.net/11147/11

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Author: search.filters.author.Ataç, EnesLanguage: search.filters.language.en

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  • Article
    Enhancing Thickness Determination of Nanoscale Dielectric Films in Phase Diffraction-Based Optical Characterization Systems With Radial Basis Function Neural Networks
    (IOP Publishing, 2023) Ataç, Enes; Karatay, Anıl; Dinleyici, Mehmet Salih
    Accurate determination of the optical properties of ultra-thin dielectric films is an essential and challenging task in optical fiber sensor systems. However, nanoscale thickness identification of these films may be laborious due to insufficient and protracted classical curve matching algorithms. Therefore, this experimental study presents an application of a radial basis function neural network in phase diffraction-based optical characterization systems to determine the thickness of nanoscale polymer films. The non-stationary measurement data with environmental and detector noise were subjected to a detailed analysis. The outcomes of this investigation are benchmarked against the linear discriminant analysis method and further verified by means of scanning electron microscopy. The results show that the neural network has reached a remarkable accuracy of 98% and 82.5%, respectively, in tests with simulation and experimental data. In this way, rapid and precise thickness estimation may be realized within the tolerance range of 25 nm, offering a significant improvement over conventional measurement techniques.
  • Article
    Citation - WoS: 2
    Citation - Scopus: 2
    Subwavelength Thickness Characterization of Curved Dielectric Films Exploiting Spatially Structured Entangled Photons
    (Optica Publishing Group, 2023) Ataç, Enes; Dinleyici, Mehmet Salih
    Precise determination of thin dielectric film optical properties is a critical issue for fiber optic sensor technologies. However, conventional methods for the optical characterization of these films not only are generally complex and tedious processes on curved surfaces but also require well-calibrated and overly sophisticated devices. We, on the other hand, propose a novel and practical quantum-based phase diffraction scheme to characterize the thickness of ultra-thin transparent dielectric films coated on an optical fiber beyond the classical diffraction limits in this paper. The approach is implemented by evaluating the effect of thickness variations on the highly visible two-photon diffraction pattern's zero crossings and amplitudes. The mathematical model and numerical simulations con-tribute to a better understanding of how the spatially structured entangled photons improve thickness precision with the help of intensity correlations and a confocal aperture. To prove the impact of the proposed system, it is compared with the classical phase diffraction method in the literature via simulations. According to the results, the thickness of the transparent dielectric films can be accurately estimated below one-twentieth of the wavelength of interest. & COPY; 2023 Optica Publishing Group
  • Article
    Citation - WoS: 5
    Citation - Scopus: 5
    Nanoscale Curved Dielectric Film Characterization Beyond Diffraction Limits Using Spatially Structured Illumination
    (Academic Press, 2020) Ataç, Enes; Dinleyici, Mehmet Salih
    Optical fiber based sensor systems often utilize thin dielectric films coated on non-planar surfaces are needed to be inspected for quality assurance. However, non-destructive optical characterization of these films is not a simple method especially on curved large surfaces. In this study, we propose a real time procedure to estimate the optical properties of sub-wavelength transparent dielectric films coated on optical fibers. The paper includes developing a mathematical model and its experimental verification. The near field phase diffraction method is combined with the structured light illumination that is spatial modes of optical fibers to estimate the thickness of the phase object beyond the classical diffraction limits. Numerical simulations and experimental results show that the film thickness can safely be characterized up to one tenth of wavelength of interest via selective spatial field distribution determined according to the morphology of the thin film. The outcomes have good agreements with destructive Scanning Electron Microscope (SEM) measurements. © 2020 Elsevier Inc.