Electrical - Electronic Engineering / Elektrik - Elektronik Mühendisliği

Permanent URI for this collectionhttps://hdl.handle.net/11147/11

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Has files: YesPublisher: search.filters.publisher.Academic Press Inc.

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  • Article
    Citation - WoS: 7
    Citation - Scopus: 9
    Analysis of a Novel Sensor Interrogation Technique Based on Fiber Cavity Ring-Down (crd) Loop and Otdr
    (Academic Press Inc., 2018) Yüksel, Kıvılcım; Yılmaz, Anıl
    We present the analysis of a remote sensor based on fiber Cavity Ring-Down (CRD) loop interrogated by an Optical Time Domain Reflectometer (OTDR) taking into account both practical limitations and the related signal processing. A commercial OTDR is used for both pulse generation and sensor output detection. This allows obtaining a compact and simple design for intensity-based sensor applications. This novel sensor interrogation approach is experimentally demonstrated by placing a variable attenuator inside the fiber loop that mimics a sensor head.
  • Article
    Citation - WoS: 5
    Citation - Scopus: 7
    A Practical Approach for Optical Characterization of a Film Coated on the Optical Fiber
    (Academic Press Inc., 2017) Ekici, Çağın; Dinleyici, Mehmet Salih
    Phase Diffraction (PD) Phase Diffraction. which is a result of the interaction of light waves with a transparent object, is exploited to characterize precisely optical properties of dielectric films coated on the optical fiber without harming any feature of the sample. Typical fiber sensor applications require films coated on the side surface of the optical fiber and optical properties of that curved films are crucial for design purposes. In this study, three Polyvinyl Alcohol (PVA) films are prepared, their thicknesses are estimated based on the phase diffraction method by fitting experimental results with a mathematical model within 2.3% error. The outcomes of this practical method show good agreement with findings of the destructive Scanning Electron Microscopy (SEM) measurements. The method has the potential to allow real time monitoring abrupt changes of surrounding medium's properties and to examine coating quality (i.e. thickness uniformity) of the film.