Electrical - Electronic Engineering / Elektrik - Elektronik Mühendisliği
Permanent URI for this collectionhttps://hdl.handle.net/11147/11
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Article Citation - WoS: 2Citation - Scopus: 2Subwavelength Thickness Characterization of Curved Dielectric Films Exploiting Spatially Structured Entangled Photons(Optica Publishing Group, 2023) Ataç, Enes; Dinleyici, Mehmet SalihPrecise determination of thin dielectric film optical properties is a critical issue for fiber optic sensor technologies. However, conventional methods for the optical characterization of these films not only are generally complex and tedious processes on curved surfaces but also require well-calibrated and overly sophisticated devices. We, on the other hand, propose a novel and practical quantum-based phase diffraction scheme to characterize the thickness of ultra-thin transparent dielectric films coated on an optical fiber beyond the classical diffraction limits in this paper. The approach is implemented by evaluating the effect of thickness variations on the highly visible two-photon diffraction pattern's zero crossings and amplitudes. The mathematical model and numerical simulations con-tribute to a better understanding of how the spatially structured entangled photons improve thickness precision with the help of intensity correlations and a confocal aperture. To prove the impact of the proposed system, it is compared with the classical phase diffraction method in the literature via simulations. According to the results, the thickness of the transparent dielectric films can be accurately estimated below one-twentieth of the wavelength of interest. & COPY; 2023 Optica Publishing GroupArticle Citation - WoS: 2Citation - Scopus: 2Investigating the Experimental Limits of the Brewster’s Angle Method(Türkiye Klinikleri Journal of Medical Sciences, 2018) Sümer, Can; Kuştepeli, Alp; Dinleyici, Mehmet SalihWe present the method, analysis, and experimental results of the Brewster’s angle method commonly used for determining the refractive indices of optical films. We show the significance of the intersection of reflectance curves, in that the necessity for substrate refractive index and film layer thickness knowledge are both eliminated. We present the conditions for the existence of the second intersection of reflectance curves and introduce a method for determining the refractive index of the substrate layer by using the angular information alone. Analytical results reveal impressive practical sensitivity and accuracy limits for the method, where the experimental results also support the theoretical analysis.