Arı, Ozan
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01. Izmir Institute of Technology
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Scholarly Output
13
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8
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14645/5787
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WoS Citation Count
101
Scopus Citation Count
105
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7.77
Scopus Citations per Publication
8.08
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11
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2
| Journal | Count |
|---|---|
| Optics InfoBase Conference Papers | 2 |
| Journal of Electronic Materials | 2 |
| Journal of Applied Physics | 1 |
| Materials Research Express | 1 |
| Physical Review B - Condensed Matter and Materials Physics | 1 |
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13 results
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Now showing 1 - 10 of 13
Conference Object Influence of Electron-Phonon Interactions on the Spectral Properties of Defects in Hexagonal Boron Nitride(OSA - The Optical Society, 2019) Arı, Ozan; Fırat, Volkan; Polat, Nihat; Çakır, Özgür.; Ateş, SerkanWe present temperature-dependent micro-PL studies on a single defect in hexagonal boron nitride. A zero-phonon line emission accompanied by Stokes and anti-Stokes phonon sidebands (˜ 6.5 meV) with a Debye-Waller factor of 0.59 is observed. © OSA 2019 © 2019 The Author(s)Article Citation - WoS: 4Citation - Scopus: 5Identifying Threading Dislocations in Cdte Films by Reciprocal Space Mapping and Defect Decoration Etching(American Institute of Physics, 2018) Polat, Mustafa; Bilgilisoy, Elif; Arı, Ozan; Öztürk, Orhan; Selamet, YusufWe study threading dislocation (TD) density of high-quality cadmium telluride (CdTe) layers grown on a (211) oriented GaAs substrate by molecular beam epitaxy. High-resolution X-ray diffraction was performed to calculate the density of screw-type TDs by measuring the broadening of the asymmetrical (511) Bragg reflections of CdTe epilayers. In addition, total TD densities were determined by the Everson-etching method and were compared with screw TDs. Our results show that the total TD densities in CdTe films were dominated by those with screw character. The screw component TDs are estimated to account for more than 90% of the total TD density. CdTe layers grown at a thickness of less than 3.0 μm typically exhibit the screw TD densities in the 106 cm-2 and 107 cm-2 range. It can be noted that as the nucleation temperature increases, i.e., ≥222 °C, both the area density of TDs with the screw component of the CdTe films and the total TD density are roughly four times larger than those of the epilayer grown at the nucleation temperature of 215 °C. Furthermore, we discuss the influence of the II/VI flux ratio on the density of threading dislocations. The contribution of screw TDs to the total TD density showed a significant decrease in roughly 30% in the case of a high II/VI flux ratio. We further examine the reciprocal space maps in the vicinity of the (422) reflections.Article Citation - WoS: 54Citation - Scopus: 53Nitrogen Doping for Facile and Effective Modification of Graphene Surfaces(Royal Society of Chemistry, 2017) Yanılmaz, Alper; Tomak, Aysel; Akbalı, Barış; Bacaksız, Cihan; Özçeri, Elif; Arı, Ozan; Senger, Ramazan Tuğrul; Selamet, Yusuf; Zareie, Hadi M.We report experimental and theoretical investigations of nitrogen doped graphene. A low-pressure Chemical Vapor Deposition (CVD) system was used to grow large-area graphene on copper foil, using ethylene as the carbon source. Nitrogen-doped graphene (N-graphene) was prepared by exposing the graphene transferred to different substrates to atomic nitrogen plasma. The effect of varying nitrogen flow rates on doping of graphene was investigated while keeping the power and time constant during the process. The N-graphene was characterized via Raman Spectroscopy, X-ray Photoelectron Spectroscopy (XPS), Scanning Tunneling Microscopy and Spectroscopy (STM and STS), and Fourier Transform Infrared spectroscopy (FTIR). Raman mapping of N-graphene was also performed to show homogeneity of nitrogen on the graphitic lattice. XPS results have revealed the presence of different nitrogen configurations in the graphitic lattice with similar doping concentrations. Density functional theory (DFT) based calculations showed that the periodic adsorption of N atoms predominantly occurs on top of the C atoms rather than through substitution of C in our N-graphene samples. Our results indicate a feasible procedure for producing N-graphene with homogenous and effective doping which would be valuable in electronic and optical applications.Article Citation - WoS: 2Citation - Scopus: 2Surface Roughness Estimation of Mbe Grown Cdte/Gaas(211)b by Ex-Situ Spectroscopic Ellipsometry(American Institute of Physics, 2016) Karakaya, Merve; Bilgilisoy, Elif; Arı, Ozan; Selamet, YusufSpectroscopic ellipsometry (SE) ranging from 1.24 eV to 5.05 eV is used to obtain the film thickness and optical properties of high index (211) CdTe films. A three-layer optical model (oxide/CdTe/GaAs) was chosen for the ex-situ ellipsometric data analysis. Surface roughness cannot be determined by the optical model if oxide is included. We show that roughness can be accurately estimated, without any optical model, by utilizing the correlation between SE data (namely the imaginary part of the dielectric function, <ϵ2 > or phase angle, ψ) and atomic force microscopy (AFM) roughness. <ϵ2 > and ψ values at 3.31 eV, which corresponds to E1 critical transition energy of CdTe band structure, are chosen for the correlation since E1 gives higher resolution than the other critical transition energies. On the other hand, due to the anisotropic characteristic of (211) oriented CdTe surfaces, SE data (<ϵ2 > and ψ) shows varieties for different azimuthal angle measurements. For this reason, in order to estimate the surface roughness by considering these correlations, it is shown that SE measurements need to be taken at the same surface azimuthal angle. Estimating surface roughness in this manner is an accurate way to eliminate cumbersome surface roughness measurement by AFM.Article Citation - WoS: 3Citation - Scopus: 3Growth and Characterization of Cdte Absorbers on Gaas by Mbe for High Concentration Pv Solar Cells(John Wiley and Sons Inc., 2015) Arı, Ozan; Polat, Mustafa; Karakaya, Merve; Selamet, YusufCdTe based II-VI absorbers are promising candidates for high concentration PV solar cells with an ideal band gap for AM1.5 solar radiation. In this study, we propose single crystal CdTe absorbers grown on GaAs substrates with a molecular beam epitaxy (MBE) which is a clean deposition technology. We show that high quality CdTe absorber layers can be grown with full width half maximum of X-ray diffraction rocking curves (XRD RC) as low as 227 arc-seconds with 0.5% thickness uniformity that a 2 μm layer is capable of absorbing 99% of AM1.5 solar radiation. Bandgap of the CdTe absorber is found as 1.483 eV from spetroscopic ellipsometry (SE) measurements. Also, high absorption coefficient is calculated from the results, which is ∼5 x 105cm-1 in solar radiation spectrum.Conference Object Reversible Energy Transfer Between a Single Defect in Hbn and Graphene(OSA - The Optical Society, 2019) Özçeri, Elif; Arı, Ozan; Balcı, Sinan; Kocabaş, Coşkun; Ateş, SerkanWe present a reversible energy transfer between a single defect in hBN and graphene. Dynamic control of Fermi level of graphene results in switching on and off single photon emission from a single quantum emitter. © OSA 2019 © 2019 The Author(s)Other Erratum To: Mbe-Grown Cdte Layers on Gaas With In-Assisted Thermal Deoxidation(Springer Verlag, 2016) Arı, Ozan; Bilgilisoy, Elif; Özçeri, Elif; Selamet, YusufArticle Citation - WoS: 6Citation - Scopus: 6Cleavage Induced Rows of Missing Atoms on Znte (110) Surface(American Physical Society, 2013) Çelebi, Cem; Arı, Ozan; Senger, Ramazan TuğrulCleavage induced rows of linear vacancy structures on p-doped ZnTe (110) surface are studied at room temperature by using cross-sectional scanning tunneling microscopy (X-STM). The oscillating contrast superimposed on the Te-driven occupied states neighboring to the vacancy cores are characterized at the atomic scale in order to determine the type of the missing component on the ZnTe surface matrix. We identify three major intensity distributions associated with different vacancy states. The X-STM images of three possible configurations comprising Zn only, Te only, and ZnTe binary vacancy structures on the ZnTe surface are modeled by using ab initio density functional theory calculations. The comparison of the X-STM measurements of each individual vacancy state to the corresponding theoretical simulation showed that unlike the Te vacancy, which leads to a local depression, the absence of Zn only or ZnTe binary gives rise to hillock features on the neighboring Te states of the ZnTe (110) cleaved surface. The theoretical STM images calculated for an undoped ZnTe crystal imply that possible doping-related effects on vacancy-induced features can be disregarded for interpreting the experimentally observed vacancy structures in our samples.Article Citation - WoS: 13Citation - Scopus: 15Hybrid J-aggregate-graphene phototransistor(American Chemical Society, 2020) Yakar, Ozan; Balcı, Osman; Uzlu, Burkay; Polat, Nahit; Arı, Ozan; Tunç, İlknur; Balcı, SinanJ-aggregates are fantastic self-assembled chromophores with a very narrow and extremely sharp absorbance band in the visible and near-infrared spectrum, and hence they have found many exciting applications in nonlinear optics, sensing, optical devices, photography, and lasing. In silver halide photography, for example, they have enormously improved the spectral sensitivity of photographic process due to their fast and coherent energy migration ability. On the other hand, graphene, consisting of single layer of carbon atoms forming a hexagonal lattice, has a very low absorption coefficient. Inspired by the fact that J-aggregates have carried the role to sense the incident light in silver halide photography, we would like to use Jaggregates to increase spectral sensitivity of graphene in the visible spectrum. Nevertheless, it has been an outstanding challenge to place isolated J-aggregate films on graphene to extensively study interaction between them. We herein noncovalently fabricate isolated J-aggregate thin films on graphene by using a thin film fabrication technique we termed here membrane casting (MC). MC significantly simplifies thin film formation of water-soluble substances on any surface via porous polymer membrane. Therefore, we reversibly modulate the Dirac point of graphene in the J-aggregate/graphene van der Waals (vdW) heterostructure and demonstrate an all-carbon phototransistor gated by visible light. Owing to the hole transfer from excited excitonic thin film to graphene layer, graphene is hole-doped. In addition, spectral and power responses of the all-carbon phototransistor have been measured by using a tunable laser in the visible spectrum. The first integration of J-aggregates with graphene in a transistor structure enables one to reversibly write and erase charge doping in graphene with visible light that paves the way for using J-aggregate/graphene vdW heterostructures in optoelectronic applications.Doctoral Thesis Molecular Beam Epitaxy Growth and Characterization of Cdte Heterostructures on Gaas-Effect of Interface, Growth, and Annealing Conditions To Crystal Quality(Izmir Institute of Technology, 2017) Arı, Ozan; Öztürk, OrhanHighly crystalline CdTe structures are desired for solar cells, x-ray detectors, electro-optical modulators, and especially in Hg1-xCdxTe infra-red detectors. Epitaxial growth of Hg1-xCdxTe infra-red layers are usually performed on lattice matched bulk CdZnTe substrates. But, limited size and fragile nature of the CdZnTe have led to a push for alternative substrates such as GaAs. The large lattice mismatch between Hg1-xCdxTe and GaAs requires an implantation of a buffer layer such as CdTe. In addition (211)B orientation is preferred due to high sticking coefficient of Hg on this orientation and suppression of twin formation. In the first part of this study, the effect of the thermal deoxidation of GaAs(211)B surface on which CdTe layers grown was investigated by various in situ and ex situ experimental techniques. The changes in the surface chemical structure and morphology of GaAs(211)B substrates with As4 and In assisted deoxidation under various conditions were presented. Secondly, the effect of the growth conditions on CdTe epilayers by using molecular beam epitaxy were investigated in two parts; (1) the initiation of the CdTe growth and (2) the equilibrium growth conditions. The correlations between the structural defects, twins, point defects, and dislocations with the growth conditions are determined. Thirdly, the effect of the cyclic annealing to the crystal and surface quality of the CdTe epilayers were investigated by using different temperatures during the annealing. Finally, the effect of the temperature uniformity during the production of the CdTe layers was investigated by the two substrate heater geometries consisting of rotational symmetric and tilted at the edge. A new approach to study the dislocations with different types of cores proposed by Ayers is applied to the zinc blende (211) crystal orientation. It has been shown that the dislocations having two different cores responded differently to both growth and annealing conditions. The results of the experimental techniques probing the dislocation density in CdTe layers are not well correlated with each other due to dual origin of these dislocations. The compressive and biaxial stresses building in the CdTe layers due to growth and annealing conditions were resolved with the investigation of the optical properties of the layers.