Key Error Rates in Physical Layer Key Generation: Theoretical Analysis and Measurement-Based Verification

dc.contributor.author Topal, Ozan Alp
dc.contributor.author Karabulut Kurt, Güneş
dc.contributor.author Özbek, Berna
dc.coverage.doi 10.1109/LWC.2017.2740290
dc.date.accessioned 2019-03-01T12:32:44Z
dc.date.available 2019-03-01T12:32:44Z
dc.date.issued 2017
dc.description.abstract Channel gains are frequently used to obtain a secret key that can be used for encryption in physical layer security systems. However, the channel gains captured by the nodes may not always be the same due to channel estimation errors. This would result in a non-zero key error rate (KER). In this letter, we obtain theoretical expressions for KER in orthogonal frequency division multiplexing systems. Tight KER approximations are provided based on Gauss-Laguerre quadrature. A measurementbased study is conducted by using software defined radio nodes to demonstrate the validity and the practicality of the provided results. en_US
dc.description.sponsorship TUBITAK (114E626) en_US
dc.identifier.citation Topal, O. A. Karabulut Kurt, G., and Özbek, B. (2017). Key error rates in physical layer key generation: Theoretical analysis and measurement-based verification. IEEE Wireless Communications Letters, 6(6), 766-769. doi:10.1109/LWC.2017.2740290 en_US
dc.identifier.doi 10.1109/LWC.2017.2740290 en_US
dc.identifier.doi 10.1109/LWC.2017.2740290
dc.identifier.issn 2162-2337
dc.identifier.scopus 2-s2.0-85028458550
dc.identifier.uri http://doi.org/10.1109/LWC.2017.2740290
dc.identifier.uri https://hdl.handle.net/11147/7135
dc.language.iso en en_US
dc.publisher Institute of Electrical and Electronics Engineers Inc. en_US
dc.relation info:eu-repo/grantAgreement/TUBITAK/EEEAG/114E626 en_US
dc.relation.ispartof IEEE Wireless Communications Letters en_US
dc.rights info:eu-repo/semantics/openAccess en_US
dc.subject Key error rate en_US
dc.subject Key extraction en_US
dc.subject Physical layer key generation en_US
dc.subject Physical layer security en_US
dc.title Key Error Rates in Physical Layer Key Generation: Theoretical Analysis and Measurement-Based Verification en_US
dc.type Article en_US
dspace.entity.type Publication
gdc.author.institutional Özbek, Berna
gdc.author.yokid 36682
gdc.bip.impulseclass C4
gdc.bip.influenceclass C4
gdc.bip.popularityclass C4
gdc.coar.access open access
gdc.coar.type text::journal::journal article
gdc.collaboration.industrial false
gdc.description.department İzmir Institute of Technology. Electrical and Electronics Engineering en_US
gdc.description.endpage 769 en_US
gdc.description.issue 6 en_US
gdc.description.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality Q1
gdc.description.startpage 766 en_US
gdc.description.volume 6 en_US
gdc.description.wosquality Q1
gdc.identifier.openalex W2750276486
gdc.identifier.wos WOS:000418645700017
gdc.index.type WoS
gdc.index.type Scopus
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gdc.oaire.downloads 2
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gdc.oaire.influence 4.422409E-9
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gdc.oaire.keywords Key extraction
gdc.oaire.keywords Physical layer key generation
gdc.oaire.keywords Key error rate
gdc.oaire.keywords Physical layer security
gdc.oaire.popularity 9.914406E-9
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gdc.oaire.sciencefields 0202 electrical engineering, electronic engineering, information engineering
gdc.oaire.sciencefields 02 engineering and technology
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gdc.opencitations.count 21
gdc.plumx.crossrefcites 16
gdc.plumx.mendeley 14
gdc.plumx.scopuscites 22
gdc.scopus.citedcount 22
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