Birleşimsel Devreler için Fourier Analizi Tabanlı Otomatik Test Örüntüsü Oluşturma
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Date
2015
Authors
Ayav, Tolga
Journal Title
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Volume Title
Publisher
IEEE
Open Access Color
Green Open Access
No
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Abstract
Fourier analysis of boolean functions has attracted great attention from computer scientists in the last decade but it still has few application areas. This work presents a Fourier analysis-based automatic test pattern generation method for combinational circuits.
Description
Ayav, Tolga/0000-0003-1426-5694
Keywords
Combinational Circuit, Fourier Analysis, Walsh Transformation, Automatic Test Pattern Generation
Fields of Science
0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology
Citation
Ayav, T. (2015, May 16-19). Birleşimsel devreler için otomatik test örüntüsü oluşturma. Paper presented at the 23rd Signal Processing and Communications Applications Conference. doi:10.1109/SIU.2015.7129939
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N/A
Source
23nd Signal Processing and Communications Applications Conference (SIU) -- MAY 16-19, 2015 -- Inonu Univ, Malatya, TURKEY
Volume
Issue
Start Page
128
End Page
131
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