Birleşimsel Devreler için Fourier Analizi Tabanlı Otomatik Test Örüntüsü Oluşturma
| dc.contributor.author | Ayav, Tolga | |
| dc.date.accessioned | 2016-12-01T13:43:46Z | |
| dc.date.available | 2016-12-01T13:43:46Z | |
| dc.date.issued | 2015 | |
| dc.description | Ayav, Tolga/0000-0003-1426-5694 | en_US |
| dc.description.abstract | Fourier analysis of boolean functions has attracted great attention from computer scientists in the last decade but it still has few application areas. This work presents a Fourier analysis-based automatic test pattern generation method for combinational circuits. | en_US |
| dc.identifier.citation | Ayav, T. (2015, May 16-19). Birleşimsel devreler için otomatik test örüntüsü oluşturma. Paper presented at the 23rd Signal Processing and Communications Applications Conference. doi:10.1109/SIU.2015.7129939 | en_US |
| dc.identifier.doi | 10.1109/SIU.2015.7129939 | |
| dc.identifier.isbn | 9781467373869 | |
| dc.identifier.issn | 2165-0608 | |
| dc.identifier.scopus | 2-s2.0-84939130297 | |
| dc.identifier.uri | http://doi.org/10.1109/SIU.2015.7129939 | |
| dc.identifier.uri | https://hdl.handle.net/11147/2564 | |
| dc.language.iso | tr | en_US |
| dc.publisher | IEEE | en_US |
| dc.relation.ispartof | 23nd Signal Processing and Communications Applications Conference (SIU) -- MAY 16-19, 2015 -- Inonu Univ, Malatya, TURKEY | en_US |
| dc.relation.ispartofseries | Signal Processing and Communications Applications Conference | |
| dc.rights | info:eu-repo/semantics/openAccess | en_US |
| dc.subject | Combinational Circuit | en_US |
| dc.subject | Fourier Analysis | en_US |
| dc.subject | Walsh Transformation | en_US |
| dc.subject | Automatic Test Pattern Generation | en_US |
| dc.title | Birleşimsel Devreler için Fourier Analizi Tabanlı Otomatik Test Örüntüsü Oluşturma | en_US |
| dc.title.alternative | Fourier Analysis-Based Automatic Test Pattern Generation for Combinational Circuits | en_US |
| dc.type | Conference Object | en_US |
| dspace.entity.type | Publication | |
| gdc.author.id | Ayav, Tolga / 0000-0003-1426-5694 | |
| gdc.author.id | Ayav, Tolga / 0000-0003-1426-5694 | en_US |
| gdc.author.institutional | Ayav, Tolga | |
| gdc.author.wosid | Ayav, Tolga/B-6369-2012 | |
| gdc.bip.impulseclass | C5 | |
| gdc.bip.influenceclass | C5 | |
| gdc.bip.popularityclass | C5 | |
| gdc.coar.access | open access | |
| gdc.coar.type | text::conference output | |
| gdc.collaboration.industrial | false | |
| gdc.description.department | İzmir Institute of Technology. Computer Engineering | en_US |
| gdc.description.departmenttemp | [Ayav, Tolga] Izmir Yuksek Teknol Enstitusu, Bilgisayar Muhendisligi Bolumu, Izmir, Turkey | en_US |
| gdc.description.endpage | 131 | en_US |
| gdc.description.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
| gdc.description.startpage | 128 | en_US |
| gdc.description.woscitationindex | Conference Proceedings Citation Index - Science | |
| gdc.identifier.openalex | W2327951161 | |
| gdc.identifier.wos | WOS:000380500900011 | |
| gdc.index.type | WoS | |
| gdc.index.type | Scopus | |
| gdc.oaire.diamondjournal | false | |
| gdc.oaire.impulse | 0.0 | |
| gdc.oaire.influence | 2.635068E-9 | |
| gdc.oaire.isgreen | false | |
| gdc.oaire.popularity | 8.7196056E-10 | |
| gdc.oaire.publicfunded | false | |
| gdc.oaire.sciencefields | 0202 electrical engineering, electronic engineering, information engineering | |
| gdc.oaire.sciencefields | 02 engineering and technology | |
| gdc.openalex.fwci | 0.0 | |
| gdc.openalex.normalizedpercentile | 0.16 | |
| gdc.opencitations.count | 0 | |
| gdc.plumx.mendeley | 3 | |
| gdc.plumx.scopuscites | 0 | |
| gdc.scopus.citedcount | 0 | |
| gdc.wos.citedcount | 0 | |
| relation.isAuthorOfPublication.latestForDiscovery | 812c2ad4-527f-4a21-8b84-f7497a71f3ce | |
| relation.isOrgUnitOfPublication.latestForDiscovery | 9af2b05f-28ac-4014-8abe-a4dfe192da5e |