Tof-Sims Depth Profiling Analysis of the Uptake of Ba2+ and Co2+ Ions by Natural Kaolinite Clay
| dc.contributor.author | Shahwan, Talal | |
| dc.contributor.author | Erten, Hasan N. | |
| dc.contributor.author | Black, Leon | |
| dc.contributor.author | Allen, Geoffrey Charles | |
| dc.coverage.doi | 10.1016/j.jcis.2004.04.013 | |
| dc.date.accessioned | 2016-06-07T13:06:47Z | |
| dc.date.available | 2016-06-07T13:06:47Z | |
| dc.date.issued | 2004 | |
| dc.description.abstract | The sorption behavior of Ba2+ and Co2+ ions on a natural clay sample rich in kaolinite was studied using time-of-flight secondary ion mass spectrometry (ToF-SIMS). Depth profiling at 10-Å steps was performed up to a 70-Å matrix depth of the clay prior to and following sorption. The results showed that Co2+ is sorbed in slightly larger quantities than Ba2+, with significant numbers of ions fixed on the outermost surface of the clay. Depletion of the ions K+, Mg 2+, and Ca2+ from the clay lattice was observed to accompany enrichment with Co2+ and Ba2+ ions. The data obtained using X-ray powder diffraction (XRPD) and scanning electron microscopy (SEM) indicated insignificant structural and morphological changes in the lattice of the clay upon sorption of both Ba2+ and Co2+ ions. Analysis using energy dispersive X-ray spectroscopy (EDS) showed that the average atomic percentage (±S.D.) of Ba and Co on kaolinite surface were 0.49±0.11 and 0.61±0.19, respectively, indicating a limited uptake capacity of natural kaolinite for both ions. | en_US |
| dc.identifier.citation | Shahwan, T., Erten, H. N., Black, L., and Allen, G. C. (2004). ToF-SIMS depth profiling analysis of the uptake of Ba2+ and Co2+ ions by natural kaolinite clay. Journal of Colloid and Interface Science, 277(1), 23-28. doi:10.1016/j.jcis.2004.04.013 | en_US |
| dc.identifier.doi | 10.1016/j.jcis.2004.04.013 | en_US |
| dc.identifier.doi | 10.1016/j.jcis.2004.04.013 | |
| dc.identifier.issn | 0021-9797 | |
| dc.identifier.issn | 0021-9797 | |
| dc.identifier.scopus | 2-s2.0-3242730550 | |
| dc.identifier.uri | http://doi.org/10.1016/j.jcis.2004.04.013 | |
| dc.identifier.uri | https://hdl.handle.net/11147/4737 | |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier Ltd. | en_US |
| dc.relation.ispartof | Journal of Colloid and Interface Science | en_US |
| dc.rights | info:eu-repo/semantics/openAccess | en_US |
| dc.subject | ToF-SIMS | en_US |
| dc.subject | Depth profiling | en_US |
| dc.subject | Kaolinite | en_US |
| dc.subject | Sorption | en_US |
| dc.subject | Time-of-flight secondary ion mass spectrometry | en_US |
| dc.title | Tof-Sims Depth Profiling Analysis of the Uptake of Ba2+ and Co2+ Ions by Natural Kaolinite Clay | en_US |
| dc.type | Article | en_US |
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| gdc.description.department | İzmir Institute of Technology. Chemistry | en_US |
| gdc.description.endpage | 28 | en_US |
| gdc.description.issue | 1 | en_US |
| gdc.description.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
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| gdc.description.startpage | 23 | en_US |
| gdc.description.volume | 277 | en_US |
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| gdc.identifier.pmid | 15276033 | |
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| gdc.oaire.keywords | Secondary Ion | |
| gdc.oaire.keywords | Secondary ion mass spectrometry | |
| gdc.oaire.keywords | magnesium ion | |
| gdc.oaire.keywords | roentgen spectroscopy | |
| gdc.oaire.keywords | Surface Properties | |
| gdc.oaire.keywords | Barium Compounds | |
| gdc.oaire.keywords | Spectrometry, Mass, Secondary Ion | |
| gdc.oaire.keywords | Energy dispersive spectroscopy | |
| gdc.oaire.keywords | barium ion | |
| gdc.oaire.keywords | Co | |
| gdc.oaire.keywords | Chlorides | |
| gdc.oaire.keywords | Kaolinite | |
| gdc.oaire.keywords | morphology | |
| gdc.oaire.keywords | Time-of-flight secondary ion mass spectrometry | |
| gdc.oaire.keywords | aluminum silicate | |
| gdc.oaire.keywords | calcium ion | |
| gdc.oaire.keywords | Kaolin | |
| gdc.oaire.keywords | X ray powder diffraction | |
| gdc.oaire.keywords | potassium ion | |
| gdc.oaire.keywords | Spectrometry | |
| gdc.oaire.keywords | Time-of-flight secondary ion mass spectrometry (ToF-SIMS) | |
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| gdc.oaire.keywords | clay | |
| gdc.oaire.keywords | Cobalt | |
| gdc.oaire.keywords | Mass | |
| gdc.oaire.keywords | time of flight mass spectrometry | |
| gdc.oaire.keywords | 540 | |
| gdc.oaire.keywords | Ba | |
| gdc.oaire.keywords | priority journal | |
| gdc.oaire.keywords | Barium | |
| gdc.oaire.keywords | Depth profiling | |
| gdc.oaire.keywords | Sorption | |
| gdc.oaire.keywords | Clay | |
| gdc.oaire.keywords | Aluminum Silicates | |
| gdc.oaire.keywords | ToF-SIMS | |
| gdc.oaire.keywords | Scanning electron microscopy | |
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