Photoconductivity Spectroscopy in Hydrogenated Microcrystalline Silicon Thin Films
| dc.contributor.author | Güneş, Mehmet | |
| dc.contributor.author | Akdaş, Deniz | |
| dc.contributor.author | Göktaş, Oktay | |
| dc.contributor.author | Carius, Reinhard | |
| dc.contributor.author | Klomfaß, Josef | |
| dc.contributor.author | Finger, Friedhelm | |
| dc.coverage.doi | 10.1023/A:1026147624811 | |
| dc.date.accessioned | 2016-05-27T11:02:29Z | |
| dc.date.available | 2016-05-27T11:02:29Z | |
| dc.date.issued | 2003 | |
| dc.description.abstract | Steady-state photoconductivity and sub-bandgap absorption measurements by the dual-beam photoconductivity (DBF) method were carried out on undoped hydrogenated microcrystalline silicon thin films prepared by VHF-PECVD and hot-wire chemical vapor deposition. The results are compared with those of the constant-photocurrent method (CPM) and photothermal deflection spectroscopy (PDS). It is found that DBP, CPM, and PDS provide complementary data on the optoelectronic processes in microcrystalline silicon. | en_US |
| dc.description.sponsorship | TÜBİTAK | en_US |
| dc.identifier.citation | Güneş, M., Akdaş, D., Göktaş, O., Carius, R., Klomfaß, J., and Finger, F. (2003). Photoconductivity spectroscopy in hydrogenated microcrystalline silicon thin films. Journal of Materials Science: Materials in Electronics, 14(10-12), 729-730. doi:10.1023/A:1026147624811 | en_US |
| dc.identifier.doi | 10.1023/A:1026147624811 | en_US |
| dc.identifier.doi | 10.1023/A:1026147624811 | |
| dc.identifier.issn | 0957-4522 | |
| dc.identifier.issn | 0957-4522 | |
| dc.identifier.scopus | 2-s2.0-0242348718 | |
| dc.identifier.uri | http://doi.org/10.1023/A:1026147624811 | |
| dc.identifier.uri | https://hdl.handle.net/11147/4671 | |
| dc.language.iso | en | en_US |
| dc.publisher | Springer Verlag | en_US |
| dc.relation.ispartof | Journal of Materials Science: Materials in Electronics | en_US |
| dc.rights | info:eu-repo/semantics/openAccess | en_US |
| dc.subject | Thin films | en_US |
| dc.subject | Photothermal deflection spectroscopy (PDS) | en_US |
| dc.subject | Chemical vapor deposition | en_US |
| dc.subject | Crystalline materials | en_US |
| dc.subject | Hydrogenation | en_US |
| dc.title | Photoconductivity Spectroscopy in Hydrogenated Microcrystalline Silicon Thin Films | en_US |
| dc.type | Conference Object | en_US |
| dspace.entity.type | Publication | |
| gdc.author.institutional | Güneş, Mehmet | |
| gdc.author.institutional | Akdaş, Deniz | |
| gdc.author.institutional | Göktaş, Oktay | |
| gdc.bip.impulseclass | C5 | |
| gdc.bip.influenceclass | C5 | |
| gdc.bip.popularityclass | C5 | |
| gdc.coar.access | open access | |
| gdc.coar.type | text::conference output | |
| gdc.collaboration.industrial | false | |
| gdc.description.department | İzmir Institute of Technology. Physics | en_US |
| gdc.description.endpage | 730 | en_US |
| gdc.description.issue | 10-12 | en_US |
| gdc.description.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
| gdc.description.scopusquality | Q2 | |
| gdc.description.startpage | 729 | en_US |
| gdc.description.volume | 14 | en_US |
| gdc.description.wosquality | Q2 | |
| gdc.identifier.openalex | W191923582 | |
| gdc.identifier.wos | WOS:000185962400030 | |
| gdc.index.type | WoS | |
| gdc.index.type | Scopus | |
| gdc.oaire.diamondjournal | false | |
| gdc.oaire.impulse | 0.0 | |
| gdc.oaire.influence | 2.635068E-9 | |
| gdc.oaire.isgreen | true | |
| gdc.oaire.keywords | Thin films | |
| gdc.oaire.keywords | Chemical vapor deposition | |
| gdc.oaire.keywords | Crystalline materials | |
| gdc.oaire.keywords | Hydrogenation | |
| gdc.oaire.keywords | Photothermal deflection spectroscopy (PDS) | |
| gdc.oaire.popularity | 3.0782712E-10 | |
| gdc.oaire.publicfunded | false | |
| gdc.openalex.collaboration | International | |
| gdc.openalex.fwci | 0.62686335 | |
| gdc.openalex.normalizedpercentile | 0.68 | |
| gdc.opencitations.count | 3 | |
| gdc.plumx.crossrefcites | 2 | |
| gdc.plumx.mendeley | 12 | |
| gdc.plumx.scopuscites | 5 | |
| gdc.scopus.citedcount | 5 | |
| gdc.wos.citedcount | 5 | |
| local.message.claim | 2022-06-16T11:22:40.679+0300 | * |
| local.message.claim | |rp01576 | * |
| local.message.claim | |submit_approve | * |
| local.message.claim | |dc_contributor_author | * |
| local.message.claim | |None | * |
| relation.isAuthorOfPublication.latestForDiscovery | b2da9e92-50cb-44af-9a8c-b28dfcaef499 | |
| relation.isOrgUnitOfPublication.latestForDiscovery | 9af2b05f-28ac-4009-8abe-a4dfe192da5e |