Ölçülmüş Çydf Verilerinin Lafortune Modeli ile Etkin Gösterimi

dc.contributor.author Ozan, Şükrü
dc.contributor.author Gümüştekin, Şevket
dc.coverage.doi 10.1109/SIU.2010.5650225
dc.date.accessioned 2021-01-24T18:28:38Z
dc.date.available 2021-01-24T18:28:38Z
dc.date.issued 2010
dc.description.abstract The bi-directional reflectance distribution function (BRDF) describes the appearance of a material by its interaction with light. In this study, Lafortune BRDF model is fitted to densely sampled measured BRDF data by using Levenberg - Marquardt Algorithm. The obtained results are visualised by a physically based ray tracing software and the proposed method is analysed. ©2010 IEEE. en_US
dc.identifier.doi 10.1109/SIU.2010.5650225
dc.identifier.isbn 978-142449671-6
dc.identifier.scopus 2-s2.0-78651420384
dc.identifier.uri https://doi.org/10.1109/SIU.2010.5650225
dc.identifier.uri https://hdl.handle.net/11147/9816
dc.language.iso tr en_US
dc.publisher IEEE en_US
dc.relation.ispartof IEEE 18th Signal Processing and Communications Applications Conference, SIU 2010 en_US
dc.rights info:eu-repo/semantics/openAccess en_US
dc.title Ölçülmüş Çydf Verilerinin Lafortune Modeli ile Etkin Gösterimi en_US
dc.title.alternative Efficient Representation of Measured Brdf Data Using Lafortune Model en_US
dc.type Conference Object en_US
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gdc.author.institutional Ozan, Şükrü
gdc.author.institutional Gümüştekin, Şevket
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gdc.description.department İzmir Institute of Technology. Electrical and Electronics Engineering en_US
gdc.description.endpage 687 en_US
gdc.description.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality N/A
gdc.description.startpage 684 en_US
gdc.description.wosquality N/A
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gdc.oaire.sciencefields 0202 electrical engineering, electronic engineering, information engineering
gdc.oaire.sciencefields 02 engineering and technology
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