Ölçülmüş Çydf Verilerinin Lafortune Modeli ile Etkin Gösterimi

dc.contributor.author Ozan, Şükrü
dc.contributor.author Gümüştekin, Şevket
dc.contributor.author Gümüştekin, Şevket
dc.contributor.other 03.05. Department of Electrical and Electronics Engineering
dc.contributor.other 03. Faculty of Engineering
dc.contributor.other 01. Izmir Institute of Technology
dc.coverage.doi 10.1109/SIU.2010.5650225
dc.date.accessioned 2021-01-24T18:28:38Z
dc.date.available 2021-01-24T18:28:38Z
dc.date.issued 2010
dc.description.abstract The bi-directional reflectance distribution function (BRDF) describes the appearance of a material by its interaction with light. In this study, Lafortune BRDF model is fitted to densely sampled measured BRDF data by using Levenberg - Marquardt Algorithm. The obtained results are visualised by a physically based ray tracing software and the proposed method is analysed. ©2010 IEEE. en_US
dc.identifier.doi 10.1109/SIU.2010.5650225
dc.identifier.isbn 978-142449671-6
dc.identifier.scopus 2-s2.0-78651420384
dc.identifier.uri https://doi.org/10.1109/SIU.2010.5650225
dc.identifier.uri https://hdl.handle.net/11147/9816
dc.language.iso tr en_US
dc.publisher IEEE en_US
dc.relation.ispartof IEEE 18th Signal Processing and Communications Applications Conference, SIU 2010 en_US
dc.rights info:eu-repo/semantics/openAccess en_US
dc.title Ölçülmüş Çydf Verilerinin Lafortune Modeli ile Etkin Gösterimi en_US
dc.title.alternative Efficient Representation of Measured Brdf Data Using Lafortune Model en_US
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gdc.author.institutional Gümüştekin, Şevket
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gdc.description.department İzmir Institute of Technology. Electrical and Electronics Engineering en_US
gdc.description.endpage 687 en_US
gdc.description.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality N/A
gdc.description.startpage 684 en_US
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gdc.oaire.sciencefields 0202 electrical engineering, electronic engineering, information engineering
gdc.oaire.sciencefields 02 engineering and technology
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