Ölçülmüş Çydf Verilerinin Lafortune Modeli ile Etkin Gösterimi
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Gümüştekin, Şevket
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Abstract
The bi-directional reflectance distribution function (BRDF) describes the appearance of a material by its interaction with light. In this study, Lafortune BRDF model is fitted to densely sampled measured BRDF data by using Levenberg - Marquardt Algorithm. The obtained results are visualised by a physically based ray tracing software and the proposed method is analysed. ©2010 IEEE.
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0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology
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687
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